80C32/80C52
Note 1 : ICC is measured with all output pins
disconnected ; XTAL1 driven with TCLCH, TCHCL =
5 ns, VIL = VSS + .5 V, VIH = VCC –.5 V ; XTAL2
N.C. ; EA = RST = Port 0 = VCC. ICC would be slighty
higher if a crystal oscillator used.
Figure 9. ICC Test Condition, Idle Mode.
All other pins are disconnected.
Idle ICC is measured with all output pins disconnected ;
XTAL1 driven with TCLCH, TCHCL = 5 ns, VIL =
VSS + 5 V, VIH = VCC –.5 V ; XTAL2 N.C ; Port 0 =
VCC ; EA = RST = VSS.
Power Down ICC is measured with all output pins
disconnected ; EA = PORT 0 = VCC ; XTAL2 N.C. ;
RST = VSS.
Note 2 : Capacitance loading on Ports 0 and 2 may cause
spurious noise pulses to be superimposed on the VOLS of
ALE and Ports 1 and 3. The noise is due to external bus
capacitance discharging into the Port 0 and Port 2 pins
when these pins make 1 to 0 transitions during bus
operations. In the worst cases (capacitive loading 100
pF), the noise pulse on the ALE line may exceed 0.45 V
may exceed 0,45 V with maxi VOL peak 0.6 V. A Schmitt
Trigger use is not necessary.
Figure 10. ICC Test Condition, Active Mode.
All other pins are disconnected.
Figure 11. ICC Test Condition, Power Down Mode.
All other pins are disconnected.
Figure 12. Clock Signal Waveform for ICC Tests in Active and Idle Modes. TCLCH = TCHCL = 5 ns.
14
MATRA MHS
Rev. G (14 Jan. 97)
TEMIC [ TEMIC SEMICONDUCTORS ]
