TABLE I. Electrical performance characteristics - continued.
Conditions 1/
-55°C ≤ TA ≤ +125°C
Group A
subgroups
Device
type
Limits
Unit
nA
Test
Symbol
ID(OFF)
unless otherwise specified
Min
Max
Drain OFF leakage
current
VIN = 2.4 V
1
2, 3
1
01
02
03
01
02
03
01
02
03
-0.25
-20
+0.25
V+ = 16.5 V,
+20
+0.25
+20
V- = -16.5 V,
VD = -15.5 V
VS = 15.5 V
VIN = 0.8 V
-0.25
-20
2, 3
1
VIN = 0.8 V or
2.4 V 2/
-0.25
-20
+0.25
+20
2, 3
1
VIN = 2.4 V
-0.25
-20
+0.25
+20
V+ = 16.5 V,
V- = -16.5 V,
VD = 15.5 V
VS = -15.5 V
2, 3
1
VIN = 0.8 V
-0.25
-20
+0.25
+20
2, 3
1
VIN = 0.8 V or
2.4 V 2/
-0.25
-20
+0.25
+20
2, 3
1
Channel ON
ID(ON)
+
VIN = 0.8 V
-0.4
-40
+0.4
+40
nA
V+ = 16.5 V,
leakage current
V- = -16.5 V,
2, 3
1
VS = VD = ±15.5 V
IS(ON)
VIN = 2.4 V
-0.4
-40
+0.4
+40
2, 3
1
VIN = 0.8 V or
2.4 V 2/
-0.4
-40
+0.4
+40
2, 3
Input current with VIN
low
Input under test = 0.8 V,
all others = 2.4 V
IIL
IIH
1, 2, 3
1, 2, 3
9, 11
10
All
All
All
-0.5
-0.5
0
+0.5
+0.5
175
240
250
400
µA
µA
ns
Input current with VIN
high
Input under test = 2.4 V,
all others = 0.8 V
Turn ON time
tON
See figure 4, RL = 300Ω,
CL = 35 pF, VS = ±10 V
0
See figure 4, RL = 300Ω,
9, 11
10
All
0
ns
V+ = 12 V, V- = 0 V, CL = 35 pF,
VS = +8 V
0
See footnotes at end of table.
SIZE
STANDARD
5962-90731
A
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
REVISION LEVEL
E
SHEET
6
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
