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5962-8986301YX 参数 Datasheet PDF下载

5962-8986301YX图片预览
型号: 5962-8986301YX
PDF下载: 下载PDF文件 查看货源
内容描述: [FIFO, 512X9, 80ns, Asynchronous, CMOS, 1.485 X 0.310 INCH, 0.230 INCH HIEGHT, DIP-28]
分类和应用: 先进先出芯片
文件页数/大小: 22 页 / 225 K
品牌: TEMIC [ TEMIC SEMICONDUCTORS ]
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TABLE I. Electrical performance characteristics - Continued.  
Conditions 1/  
-55°C +125°C  
4.5 V < V  
Group A  
Device  
type  
Limits  
Min  
Unit  
ns  
Test  
Symbol  
T
subgroups  
A
CC < 5.5 V  
Max  
unless otherwise specified  
01  
02  
03  
04  
05  
06  
01  
02  
03  
04  
05  
06  
Expansion out low  
delay from clock  
t
See figure 3  
9, 10, 11  
9, 10, 11  
80  
65  
50  
40  
30  
25  
80  
65  
50  
40  
30  
25  
XOL  
Expansion out high  
delay from clock  
t
ns  
XOH  
1/ AC tests are performed with input rise and fall times of 5ns or less, timing reference levels of 1.5 V, input pulse levels  
of 0 V to 3.0 V, and the output load on figure 4.  
2/ These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.  
3/ Tested initially and after any design or process changes that affect that parameter, and therefore shall be guaranteed to  
the limits specified in table1.  
4/ Transition is measured at steady-state high level -500 mV or steady-state low level +500 mV on the output from the 1.5 V  
level on the input.  
3.2.4 Die overcoat. Polyimide and silicone coatings are allowable as an overcoat on the die for alpha particle  
protection provided that each coated microcircuit inspection lot (see MIL-M-38510), shall be subjected to and pass the  
Internal Moisture Content Test, (see method 1018 of MIL-STD-883), the frequency of the internal water vapor testing may  
not be decreased unless approved by the preparing activity.  
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance  
characteristics are as specified in table I and shall apply over the full case operating temperature range.  
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The  
electrical tests for each subgroup are described in table I.  
3.5 Marking. Marking shall be in accordance with MIL-STD-883 (see 3.1 herein). The part shall be marked with the  
PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be marked as listed in MIL-BUL-103 (see 6.6  
herein).  
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as  
an approved source of supply in MIL-BUL-103 (see 6.6 herein). The certificate of compliance submitted to DESC-ECC  
prior to listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of  
MIL-STD-883 (see 3.1 herein) and the requirements herein.  
SIZE  
STANDARDIZED  
5962-89863  
A
MILITARY DRAWING  
DEFENSE ELECTRONICS SUPPLY CENTER  
REVISION LEVEL  
SHEET  
DAYTON, OHIO 45444  
9
DESC FORM 193A  
SEP 87  
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