TABLE I. Electrical performance characteristics - Continued.
Conditions 1/
-55°C +125°C
4.5 V < V
Group A
Device
type
Limits
Min
Unit
pF
Test
Symbol
T
subgroups
A
CC < 5.5 V
Max
8
unless otherwise specified
= 5.0 V
CC
Input capacitance
C
C
3/
V
T
4
4
All
All
All
IN
= +25°C, f = 1 Mhz
A
See 4.3.1c
Output capacitance
3/
V
T
= 5.0 V
CC
8
pF
OUT
= +25°C, f = 1 Mhz
A
See 4.3.1c
Functional tests
Read cycle time
See 4.3.1d
7,8
01
02
100
80
ns
ns
t
See figure 3
9, 10, 11
RC
03
04
65
50
05
06
40
35
01
Access time
t
80
65
50
40
30
25
9, 10, 11
A
02
03
04
05
06
01
20
15
10
80
65
50
40
30
25
Read recovery time
Read pulse width
t
t
9, 10, 11
9, 10, 11
ns
ns
RR
02, 03
04,05,06
01
PR
02
03
04
05
06
Read low to low Z
t
t
3/ 4/
All
3
3
ns
9, 10, 11
LZR
Read high to data valid
Read high to high Z
All
ns
9, 10, 11
9, 10, 11
DVR
01,02,03
04
30
25
20
18
t
3/ 4/
ns
HZR
WC
05
06
01
100
80
65
50
40
35
Write cycle time
t
9, 10, 11
ns
02
03
04
05
06
See footnotes at end of table.
SIZE
STANDARDIZED
MILITARY DRAWING
5962-89863
A
DEFENSE ELECTRONICS SUPPLY CENTER
DAYTON, OHIO 45444
REVISION LEVEL
SHEET
5
DESC FORM 193A
SEP 87
TEMIC [ TEMIC SEMICONDUCTORS ]
