TABLE IIA. Electrical test requirements. 1/ 2/ 3/ 4/ 5/ 6/ 7/
Line
no.
Test
requirements
Subgroups
(per method
5005, table I)
Subgroups
(per MIL-PRF-38535,
table III)
Device class M Device class Q
Device class V
1
2
Interim electrical
parameters (see 4.2)
1,7,9
1,7,9
Static burn-in I
method 1015
Not
required
Not
required
Not
required
3
4
Same as line 1
1*,7* ∆
Dynamic burn-in
(method 1015)
Required
Required
Required
5
6
Same as line 1
1*,7* ∆
Final electrical
parameters
1*,2,3,7*,
8A,8B,9,10,11
1*,2,3,7*,
1*,2,3,7*,
8A,8B,9,10,11 8A,8B,9,10,11
7
Group A test
requirements
1,2,3,4**,7,8A,
8B,9,10,11
1,2,3,4**,7,
8A,8B,9,10,11
1,2,3,4**,7,
8A,8B,9,10,11
8
9
Group C end-point
electrical parameters
2,3,7,
8A,8B
2,3,7,
8A,8B
1,2,3,7,
8A,8B,9,10,11 ∆
Group D end-point
electrical parameters
2,3,7,
8A,8B
2,3,7,
8A,8B
2,3,7
8A,8B
10
Group E end-point
1,7,9
1,7,9
1,7,9
electrical parameters
1/ Blank spaces indicate tests are not applicable.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ Subgroups 7 and 8 functional tests shall verify the truth table.
4/ * indicates PDA applies to subgroups 1 and 7.
5/ ** see 4.4.1e.
6/ ∆ indicates delta limit (see table IIB) shall be required where specified, and the delta values shall be
computed with reference to the previous interim electrical parameters (see line 1).For device classes Q and
V performance of delta limits shall be as specified in the manufacturer's QM plan.
7/ See 4.4.1d.
4.2.2 Additional criteria for device classes Q and V.
a. The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the device
manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with MIL-
PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1015 of MIL-STD-883.
b.Interim and final electrical test parameters shall be as specified in table IIA herein.
c. Additional screening for device class V beyond the requirements of device class Q shall be as specified in MIL-PRF-
38535, appendix B.
SIZE
STANDARD
5962-89568
MICROCIRCUIT DRAWING
A
REVISION LEVEL
H
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
28
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
