TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Conditions
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
type
Limits
Unit
C
Min
Max
VSS = 0 V
4.5 V ≤ V ≤ 5.5 V
CC
unless otherwise specified
01
02
03
04
05
06
07
08
120
80
65
50
40
30
20
15
Expansion out low
delay from clock
tXOL
CL = 30 pF,
See figures 4 and 5
9,10,11
ns
M, D
9 1/
2/
01
02
03
04
05
06
07
08
120
80
65
50
40
30
20
15
Expansion out high
delay from clock
tXOH
CL = 30 pF,
See figures 4 and 5
9,10,11
ns
M, D
9 1/
2/
01
02
03
04
05
06
07
08
120
80
65
50
40
30
20
15
tXI
CL = 30 pF,
See figures 4 and 5
9,10,11
XI pulse width
ns
M, D
9 1/
2/
tXIR
CL = 30 pF,
9,10,11
All
10
XI recovery time
See figures 4 and 5
ns
M, D
9 1/
2/
See footnotes at end of table.
SIZE
STANDARD
MICROCIRCUIT DRAWING
5962-89568
A
REVISION LEVEL
H
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
13
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
