TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Conditions
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
type
Limits
Min Max
Unit
C
VSS = 0 V
4.5 V ≤ V ≤ 5.5 V
CC
unless otherwise specified
01-03
04
05
06
07
60
Read low to empty
flag low
tREF
CL = 30 pF,
See figures 4 and 5
9,10,11
45
35
30
20
15
ns
08
M, D
9 1/
2/
01-03
04
05
06
07
60
45
35
30
20
25
Read high to full flag
high
tRFF
tWEF
tWFF
CL = 30 pF,
9,10,11
See figures 4 and 5
ns
ns
08
M, D
9 1/
2/
01-03
04
05
06
07
60
45
35
30
20
15
Write high to empty
flag high
CL = 30 pF,
See figures 4 and 5
9,10,11
08
M, D
9 1/
2/
01-03
04
05
06
07,08
60
45
35
30
20
Write low to full flag
low
CL = 30 pF,
See figures 4 and 5
9,10,11
ns
ns
M, D
9 1/
2/
01
02
03
04
05
06
07
08
140
100
80
65
50
40
30
25
Reset to half-full and
full-flag high
tHFH
tFFH
CL = 30 pF,
See figures 4 and 5
9,10,11
M, D
9 1/
2/
See footnotes at end of table.
SIZE
STANDARD
5962-89568
MICROCIRCUIT DRAWING
A
REVISION LEVEL
H
SHEET
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
12
DSCC FORM 2234
APR 97
TEMIC [ TEMIC SEMICONDUCTORS ]
