TABLE I. Electrical performance characteristics Continued.
Test
Symbol
Conditions
-55°C
≤
TC
≤
+125°C
V
SS
= 0 V
4.5 V
≤
VCC
≤
5.5 V
unless otherwise specified
C
L
= 30 pF,
See figures 4 and 5
Group A
subgroups
Device
type
Limits
Min
Max
Unit
01
f
S
Shift frequency
9,10,11
02
03
04
05
06
07
08
M, D
9 1/
01
t
RC
Read cycle time
C
L
= 30 pF,
See figures 4 and 5
9,10,11
02
03
04
05
06
07
08
M, D
9 1/
01
t
A
Access time
C
L
= 30 pF,
See figures 4 and 5
9,10,11
02
03
04
05
06
07
08
M, D
9 1/
01,02
t
RR
Read recovery time
C
L
= 30 pF,
See figures 4 and 5
M, D
See footnotes at end of table.
9,10,11
03,04
05-08
9 1/
20
15
10
2/
140
100
80
65
50
40
30
25
2/
7.0
10
12.5
15
20
25
33.3
40
2/
MHz
ns
120
80
65
50
40
30
20
15
2/
ns
ns
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
H
5962-89568
SHEET
7
TEMIC [ TEMIC SEMICONDUCTORS ]
