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6517B-3Y-EW-STD 参数 Datasheet PDF下载

6517B-3Y-EW-STD图片预览
型号: 6517B-3Y-EW-STD
PDF下载: 下载PDF文件 查看货源
内容描述: [6517B Electrometer/High Resistance Meter]
分类和应用:
文件页数/大小: 12 页 / 921 K
品牌: TEKTRONIX [ TEKTRONIX, INC. ]
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Datasheet  
Internal Test Sequences Expand  
and Simplify Applications  
Accessories Extend Measurement  
Capabilities  
A variety of optional accessories can be used to extend  
the 6517B applications and enhance its performance.  
The 6517B has a number of internal test sequences that  
assists in easily setting up and performing a number of  
tests. Device characterization sequences include diode  
leakage current measurement, capacitor leakage current  
measurement, cable insulation resistance measurement,  
and resistor voltage coefficient measurement. Resistivity  
and resistance tests include volume resistivity, surface  
resistivity, and surface insulation resistance testing.  
Parameters can be characterized as a function of voltage  
with the square wave and staircase test sequences.  
The 8009 Resistivity Test Fixture is a guarded test fixture  
for measuring volume and surface resistivities of sample  
materials. It has stainless-steel electrodes built to ASTM  
D257 standards. The fixture’s electrode dimensions are  
pre-programmed into the 6517B, so there’s no need to  
calculate those values then enter them manually. This  
accessory is designed to protect you from contact with  
potentially hazardous voltages —opening the lid of the test  
fixture automatically turns off the 6517B’s voltage source.  
In addition to its built-in tests, the 6517B excels in low  
current, high impedance voltage, resistance, and charge  
measurements in areas of research such as physics,  
optics, and materials science. The electrometer’s  
extremely low voltage burden makes it particularly  
valuable for use in solar cell characterization applications  
and its built-in voltage source and low current sensitivity  
make it an excellent solution for high resistance  
measurements of nanomaterials such as polymer-based  
nanowires, other nanomaterials, ceramics, dielectric films,  
and biomaterials.  
With its highly responsive measurements and DMM-like  
operation, the 6517B performs well in quality control,  
design engineering, and production test applications  
involving leakage current, breakdown, and resistance  
testing. Volume and surface resistivity measurements  
on non-conductive materials are particularly enhanced  
by the 6517B’s voltage reversal method. The 6517B is  
also excellent for electrochemistry applications such  
as high impedance, ion-selective electrodes and pH  
measurements, conductivity cells, and potentiometry.  
8009 Resistivity Test Fixture is compliant with American Society for Testing  
and Materials (ASTM) Standard D257 Standard Test Methods for DC  
Resistance or Conductance of Insulating Materials. The 8009 combined  
with the 6517B provides a complete system for making high quality, safe  
resistivity measurements. The 8009 comes with the 6517B-ILC-3 Safety  
Interlock Cable, the 7078-TRX-3 Triax-Triax Cable, and the 8607 1 kV  
Source Voltage Banana Jack Cable Set.  
6521 and 6522 Low Current, 10-Channel  
Scanner Cards  
Typical Applications  
Two optional 10-channel plug-in scanner cards are  
available to extend the measurement performance of  
the 6517B Electrometer/High Resistance Meter. The  
cards install directly into the option slot in the back panel  
of the 6517B. The cards are also compatible with the  
6517A and 6517.  
• Nanomaterial characterization  
• Polymer electrical characterization  
• Beam measurements  
• Dosimetry  
• Device leakage current measurements  
• Insulation resistance measurements  
• Optoelectronic detector characterization  
• Volume and surface resistivity  
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