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ICM-20602 参数 Datasheet PDF下载

ICM-20602图片预览
型号: ICM-20602
PDF下载: 下载PDF文件 查看货源
内容描述: [High Performance 6-Axis MEMS MotionTracking Device]
分类和应用:
文件页数/大小: 57 页 / 1348 K
品牌: TDK [ TDK ELECTRONICS ]
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ICM-20602  
ICM-20602 Solution Using SPI Interface  
In the figure below, the system processor is an SPI master to the ICM-20602. Pins 2, 3, 4, and 5 are used to support the SPC, SDI,  
SDO, and CS signals for SPI communications.  
Processor SPI Bus: for reading all  
data from MPU and for configuring  
MPU  
Interrupt  
Status  
Register  
INT  
nCS  
CS  
ICM-20602  
SDO  
SDI  
System  
Processor  
Slave SPI  
Serial  
Interface  
SPC  
SDI  
SPC  
SDO  
FIFO  
Config  
Register  
Sensor  
Register  
Factory  
Calibration  
Bias & LDOs  
VDD  
GND  
REGOUT  
Figure 7. ICM-20602 Solution Using SPI Interface  
4.9 SELF-TEST  
Self-test allows for the testing of the mechanical and electrical portions of the sensors. The self-test for each measurement axis can  
be activated by means of the gyroscope and accelerometer self-test registers (registers 27 and 28).  
When the self-test is activated, the electronics cause the sensors to be actuated and produce an output signal. The output signal is  
used to observe the self-test response.  
The self-test response is defined as follows:  
SELF-TEST RESPONSE = SENSOR OUTPUT WITH SELF-TEST ENABLED SENSOR OUTPUT WITH SELF-TEST DISABLED  
The self-test response for each gyroscope axis is defined in the gyroscope specification table, while that for each accelerometer axis  
is defined in the accelerometer specification table.  
When the value of the self-test response is within the specified min/max limits of the product specification, the part has passed self-  
test. When the self-test response exceeds the min/max values, the part is deemed to have failed self-test.  
For further information on Self-Test please refer to sections 8 and 9 of this document.  
4.10 CLOCKING  
The ICM-20602 has a flexible clocking scheme, allowing a variety of internal clock sources to be used for the internal synchronous  
circuitry. This synchronous circuitry includes the signal conditioning and ADCs, and various control circuits and registers. An on-chip  
PLL provides flexibility in the allowable inputs for generating this clock.  
Allowable internal sources for generating the internal clock are:  
a) An internal relaxation oscillator  
b) Auto-select between internal relaxation oscillator and gyroscope MEMS oscillator to use the best available source  
The only setting supporting specified performance in all modes is option b). It is recommended that option b) be used.  
4.11 SENSOR DATA REGISTERS  
The sensor data registers contain the latest gyroscope, accelerometer, and temperature measurement data. They are read-only  
registers, and are accessed via the serial interface. Data from these registers may be read anytime.  
Document Number: DS-000176  
Revision: 1.0  
Page 21 of 57  
Revision Date: 10/03/2016  
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