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HV2116PJ 参数 Datasheet PDF下载

HV2116PJ图片预览
型号: HV2116PJ
PDF下载: 下载PDF文件 查看货源
内容描述: 8通道高压模拟开关 [8-Channel High Voltage Analog Switch]
分类和应用: 复用器开关复用器或开关信号电路高压
文件页数/大小: 9 页 / 91 K
品牌: SUPERTEX [ Supertex, Inc ]
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HV2116
8-Channel High Voltage Analog Switch
Ordering Information
Package Options
V
PP
– V
NN
160V
28-lead plastic
chip carrier
HV2116PJ
Die
HV2116X
Features
ETE –
SOL
General Description
– OB
Not recommended for new designs. Please use HV202
instead.
This device is an 8-channel high-voltage analog switch integrated
circuit (IC) intended for use in applications requiring high voltage
switching controlled by low voltage control signals, such as ultra-
sound imaging and printers. Input data is shifted into an 8-bit shift
register which can then be retained in an 8-bit latch. To reduce
any possible clock feedthrough noise, Latch Enable (LE) should
be left high until all bits are clocked in. Using HVCMOS technol-
ogy, this switch combines high voltage bilateral DMOS switches
and low power CMOS logic to provide efficient control of high
voltage analog signals.
This IC is suitable for various combinations of high voltage sup-
plies, e.g., for HV2116 +40V/-120V, or +80V/-80V or +150V/-10V.
HVCMOS
®
technology for high performance
Very low quiescent power dissipation – 10µA
Output On-resistance typically 22 ohms
Low parasitic capacitances
DC to 10MHz analog signal frequency
-50dB typical output off isolation at 5MHz
CMOS logic circuitry for low power
Excellent noise immunity
On-chip shift register, and latch logic circuitry
Flexible high voltage supplies
Surface mount package available
13
13
Absolute Maximum Ratings*
V
DD
logic power supply voltage
V
PP
- V
NN
supply voltage
V
PP
positive high voltage supply
V
NN
Negative high voltage supply
Logic input voltages
Analog signal range
Peak analog signal current/channel
Storage temperature
Power dissipation
-0.5V to +18V
174V
-0.5V to +160V
+0.5V to -160V
-0.5V to V
DD
+0.3V
V
NN
to V
PP
3.0A
-65°C to +150°C
1.2W
*Absolute Maximum Ratings are those values beyond which damage to the
device may occur. Functional operation under these conditions is not implied.
Continuous operation of the device at the absolute rating level may affect
device reliability.
13-57