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STM32F103R4 参数 Datasheet PDF下载

STM32F103R4图片预览
型号: STM32F103R4
PDF下载: 下载PDF文件 查看货源
内容描述: 基于ARM的低密度高性能线的32位MCU,具有16或32 KB闪存, USB , CAN ,6个定时器, 2的ADC ,6个通信接口 [Low-density performance line, ARM-based 32-bit MCU with 16 or 32 KB Flash, USB, CAN, 6 timers, 2 ADCs, 6 communication interfaces]
分类和应用: 闪存通信
文件页数/大小: 80 页 / 1067 K
品牌: STMICROELECTRONICS [ ST ]
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Electrical characteristics  
STM32F103x4, STM32F103x6  
Table 26. Low-power mode wakeup timings  
Symbol Parameter  
Typ  
Unit  
(1)  
Wakeup from Sleep mode  
1.8  
3.6  
µs  
tWUSLEEP  
Wakeup from Stop mode (regulator in run mode)  
(1)  
µs  
tWUSTOP  
Wakeup from Stop mode (regulator in low power  
mode)  
5.4  
50  
(1)  
Wakeup from Standby mode  
µs  
tWUSTDBY  
1. The wakeup times are measured from the wakeup event to the point in which the user application code  
reads the first instruction.  
5.3.8  
5.3.9  
48/80  
PLL characteristics  
The parameters given in Table 27 are derived from tests performed under ambient  
temperature and V supply voltage conditions summarized in Table 9.  
DD  
Table 27. PLL characteristics  
Value  
Symbol  
Parameter  
Unit  
Min(1)  
Typ  
Max(1)  
PLL input clock(2)  
1
8.0  
25  
60  
MHz  
%
fPLL_IN  
PLL input clock duty cycle  
PLL multiplier output clock  
PLL lock time  
40  
16  
fPLL_OUT  
tLOCK  
72  
MHz  
µs  
200  
300  
Jitter  
Cycle-to-cycle jitter  
ps  
1. Based on characterization, not tested in production.  
2. Take care of using the appropriate multiplier factors so as to have PLL input clock values compatible with  
the range defined by fPLL_OUT  
.
Memory characteristics  
Flash memory  
The characteristics are given at T = 40 to 105 °C unless otherwise specified.  
A
Table 28. Flash memory characteristics  
Symbol  
Parameter  
Conditions  
Min(1)  
Typ  
Max(1) Unit  
tprog  
16-bit programming time TA–40 to +105 °C  
40  
20  
20  
52.5  
70  
40  
40  
µs  
ms  
ms  
tERASE Page (1 KB) erase time TA –40 to +105 °C  
tME  
Mass erase time  
TA –40 to +105 °C  
Doc ID 15060 Rev 3  
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