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STM32F103RET6 参数 Datasheet PDF下载

STM32F103RET6图片预览
型号: STM32F103RET6
PDF下载: 下载PDF文件 查看货源
内容描述: 闪存256到512千字节 [256 to 512 Kbytes of Flash memory]
分类和应用: 闪存微控制器和处理器外围集成电路PC时钟
文件页数/大小: 130 页 / 1933 K
品牌: STMICROELECTRONICS [ ST ]
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STM32F103xC, STM32F103xD, STM32F103xE  
Output voltage levels  
Electrical characteristics  
Unless otherwise specified, the parameters given in Table 47 are derived from tests  
performed under ambient temperature and V supply voltage conditions summarized in  
DD  
Table 10. All I/Os are CMOS and TTL compliant.  
Table 47. Output voltage characteristics  
Symbol  
Parameter  
Conditions  
Min  
Max  
Unit  
Output low level voltage for an I/O pin  
when 8 pins are sunk at same time  
(1)  
CMOS port(2)  
IIO = +8 mA  
VOL  
0.4  
V
Output high level voltage for an I/O pin  
when 8 pins are sourced at same time  
(3)  
2.7 V < VDD < 3.6 V  
VOH  
VDD–0.4  
Output low level voltage for an I/O pin  
when 8 pins are sunk at same time  
(1)  
TTL port(2)  
IIO =+ 8mA  
VOL  
0.4  
1.3  
0.4  
V
V
V
Output high level voltage for an I/O pin  
when 8 pins are sourced at same time  
(3)  
2.7 V < VDD < 3.6 V  
VOH  
2.4  
Output low level voltage for an I/O pin  
when 8 pins are sunk at same time  
(1)(4)  
VOL  
I
IO = +20 mA  
2.7 V < VDD < 3.6 V  
Output high level voltage for an I/O pin  
when 8 pins are sourced at same time  
(3)(4)  
VOH  
VDD–1.3  
VDD–0.4  
Output low level voltage for an I/O pin  
when 8 pins are sunk at same time  
(1)(4)  
VOL  
IIO = +6 mA  
2 V < VDD < 2.7 V  
Output high level voltage for an I/O pin  
when 8 pins are sourced at same time  
(3)(4)  
VOH  
1. The IIO current sunk by the device must always respect the absolute maximum rating specified in Table 8  
and the sum of IIO (I/O ports and control pins) must not exceed IVSS  
.
2. TTL and CMOS outputs are compatible with JEDEC standards JESD36 and JESD52.  
3. The IIO current sourced by the device must always respect the absolute maximum rating specified in  
Table 8 and the sum of IIO (I/O ports and control pins) must not exceed IVDD  
.
4. Based on characterization data, not tested in production.  
Doc ID 14611 Rev 8  
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