Electrical characteristics
STM32F103xC, STM32F103xD, STM32F103xE
5.3.4
Embedded reference voltage
The parameters given in Table 12 are derived from tests performed under ambient
temperature and V supply voltage conditions summarized in Table 9.
DD
Table 12. Embedded internal reference voltage
Symbol
Parameter
Conditions
Min
Max Unit
Typ
−40 °C < TA < +105 °C
−40 °C < TA < +85 °C
1.16 1.20 1.26
1.16 1.20 1.24
V
V
VREFINT Internal reference voltage
ADC sampling time when
reading the internal reference
voltage
(1)
TS_vrefint
5.1
17.1
µs
1. Shortest sampling time can be determined in the application by multiple iterations.
5.3.5
Supply current characteristics
The current consumption is measured as described in Figure 12: Current consumption
measurement scheme.
Maximum current consumption
The MCU is placed under the following conditions:
●
●
●
All I/O pins are in input mode with a static value at V or V (no load)
DD SS
All peripherals are disabled except when explicitly mentioned
The Flash memory access time is adjusted to the f frequency (0 wait state from 0
HCLK
to 24 MHz, 1 wait state from 24 to 48 MHz and 2 wait states above)
●
●
Prefetch in ON (reminder: this bit must be set before clock setting and bus prescaling)
When the peripherals are enabled f
= f
/2, f
= f
PCLK1
HCLK
PCLK2 HCLK
The parameters given in Table 13, Table 14 and Table 15 are derived from tests performed
under ambient temperature and V supply voltage conditions summarized in Table 9.
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