欢迎访问ic37.com |
会员登录 免费注册
发布采购

STM32F103R8T6 参数 Datasheet PDF下载

STM32F103R8T6图片预览
型号: STM32F103R8T6
PDF下载: 下载PDF文件 查看货源
内容描述: 性能线,基于ARM的32位MCU和Flash , USB , CAN , 7个16位定时器,2个ADC和9通信接口 [Performance line, ARM-based 32-bit MCU with Flash, USB, CAN, seven 16-bit timers, two ADCs and nine communication interfaces]
分类和应用: 微控制器和处理器外围集成电路PC通信时钟
文件页数/大小: 67 页 / 1083 K
品牌: STMICROELECTRONICS [ STMICROELECTRONICS ]
 浏览型号STM32F103R8T6的Datasheet PDF文件第36页浏览型号STM32F103R8T6的Datasheet PDF文件第37页浏览型号STM32F103R8T6的Datasheet PDF文件第38页浏览型号STM32F103R8T6的Datasheet PDF文件第39页浏览型号STM32F103R8T6的Datasheet PDF文件第41页浏览型号STM32F103R8T6的Datasheet PDF文件第42页浏览型号STM32F103R8T6的Datasheet PDF文件第43页浏览型号STM32F103R8T6的Datasheet PDF文件第44页  
Electrical characteristics
STM32F103xx
5.3.10
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the
device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
Electrostatic discharge (ESD)
(positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 1000-4-2 standard.
FTB:
A Burst of Fast Transient voltage (positive and negative) is applied to V
DD
and
V
SS
through a 100 pF capacitor, until a functional disturbance occurs. This test is
compliant with the IEC 1000-4-4 standard.
A device reset allows normal operations to be resumed.
The test results are given in
They are based on the EMS levels and classes
defined in application note AN1709.
Table 25.
Symbol
EMS characteristics
(1)
Parameter
Conditions
Level/
Class
TBD
V
FESD
V
DD
=
3.3 V, T
A
=
+25 °C,
Voltage limits to be applied on any I/O pin to
f
HCLK
=48
MHz
induce a functional disturbance
conforms to IEC 1000-4-2
Fast transient voltage burst limits to be
V
DD
=
3.3 V, T
A
=
+25 °C,
applied through 100pF on V
DD
and V
SS
pins f
HCLK
=
48 MHz
to induce a functional disturbance
conforms to IEC 1000-4-4
V
EFTB
4A
1. TBD stands for to be determined.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
Corrupted program counter
Unexpected reset
Critical Data corruption (control registers...)
40/67