M25P32
Test conditions specified in Table 10. and Table 11.
Symbol
Alt.
Parameter
Output Disable Time
Min.
Typ.
Max.
Unit
ns
ns
ns
ns
ns
ns
ns
ns
2
t
8
8
t
DIS
SHQZ
t
t
V
Clock Low to Output Valid
Output Hold Time
CLQV
t
t
0
5
5
5
5
CLQX
HO
t
HOLD Setup Time (relative to C)
HOLD Hold Time (relative to C)
HOLD Setup Time (relative to C)
HOLD Hold Time (relative to C)
HOLD to Output Low-Z
HLCH
t
CHHH
t
HHCH
t
CHHL
2
t
8
8
t
LZ
HHQX
2
4
4
t
HZ
HOLD to Output High-Z
ns
ns
ns
µs
t
HLQZ
Write Protect Setup Time
Write Protect Hold Time
20
t
t
WHSL
100
SHWL
2
S High to Deep Power-down Mode
3
t
DP
S High to Standby Power mode without
Electronic Signature Read
2
2
30
µs
µs
t
RES1
RES2
S High to Standby Power mode with Electronic
Signature Read
30
t
t
Write Status Register Cycle Time
Page Program Cycle Time
Sector Erase Cycle Time
Bulk Erase Cycle Time
5
1.4
1
15
5
ms
ms
s
W
t
PP
t
SE
3
t
BE
34
80
s
Note: 1. t + t must be greater than or equal to 1/ f (max)
CH
CL
C
2. Value guaranteed by characterization, not 100% tested in production.
3. Expressed as a slew-rate.
4. Only applicable as a constraint for a WRSR instruction when SRWD is set at 1.
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STMICROELECTRONICS [ ST ]
