M25P10-A
Table 15. AC Characteristics (25MHz Operation)
Test conditions specified in
and
Symbol
f
C
f
R
t
CH (1)
t
CL (1)
t
CLCH (2)
t
CHCL (2)
t
SLCH
t
CHSL
t
DVCH
t
CHDX
t
CHSH
t
SHCH
t
SHSL
t
SHQZ (2)
t
CLQV
t
CLQX
t
HLCH
t
CHHH
t
HHCH
t
CHHL
t
HHQX (2)
t
HLQZ (2)
t
WHSL (4)
t
SHWL (4)
t
DP (2)
t
RES1 (2)
t
RES2 (2)
Note: 1.
2.
3.
4.
Alt.
f
C
Parameter
Clock Frequency for the following instructions: FAST_READ,
PP, SE, BE, DP, RES, WREN, WRDI, RDSR, WRSR
Clock Frequency for READ instructions
Min.
D.C.
D.C.
18
18
0.1
0.1
10
10
5
5
10
10
100
Typ.
Max.
25
20
Unit
MHz
MHz
ns
ns
V/ns
V/ns
ns
ns
ns
ns
ns
ns
ns
t
CLH
t
CLL
Clock High Time
Clock Low Time
Clock Rise Time
3
(peak to peak)
Clock Fall Time
3
(peak to peak)
t
CSS
S Active Setup Time (relative to C)
S Not Active Hold Time (relative to C)
t
DSU
t
DH
Data In Setup Time
Data In Hold Time
S Active Hold Time (relative to C)
S Not Active Setup Time (relative to C)
t
CSH
t
DIS
t
V
t
HO
S Deselect Time
Output Disable Time
Clock Low to Output Valid
Output Hold Time
HOLD Setup Time (relative to C)
HOLD Hold Time (relative to C)
HOLD Setup Time (relative to C)
HOLD Hold Time (relative to C)
15
15
0
10
10
10
10
15
20
20
100
3
3
1.8
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
µs
µs
t
LZ
t
HZ
HOLD to Output Low-Z
HOLD to Output High-Z
Write Protect Setup Time
Write Protect Hold Time
S High to Deep Power-down Mode
S High to Standby Mode without Electronic Signature Read
S High to Standby Mode with Electronic Signature Read
t
CH
+ t
CL
must be greater than or equal to 1/ f
C
Value guaranteed by characterization, not 100% tested in production.
Expressed as a slew-rate.
Only applicable as a constraint for a WRSR instruction when SRWD is set at 1.
32/41
STMICROELECTRONICS [ STMICROELECTRONICS ]
