HCF4053B
DC SPECIFICATIONS
Test Condition
Symbol
Parameter
V
IS
(V)
V
EE
(V)
V
SS
(V)
V
DD
(V)
5
10
15
20
5
10
15
5
10
15
18
T
A
= 25°C
Min.
Typ.
0.04
0.04
0.04
0.08
470
180
125
10
10
5
±0.1
Max.
5
10
20
100
1050
400
280
Value
-40 to 85°C -55 to 125°C Unit
Min.
Max.
150
300
600
3000
1200
520
360
Min.
Max.
150
300
600
3000
1200
520
360
I
L
Quiescent Device
Current (all
switches ON or all
switches OFF)
µA
SWITCH
R
ON
Resistance
0 < V
I
<
V
DD
0 < V
I
<
V
DD
0
0
Ω
∆
ON
Resistance
∆
RON
(between any 2 of
4 switches)
Channel Leakage
Current (All
Channel OFF)
(COMMON O/I)
Channel Leakage
Current (Any
Channel OFF)
Input Capacitance
Output
Capacitance
Feed through
0
0
0
0
Ω
100
1000
1000
nA
OFF*
OFF*
0
0
18
±0.1
100
1000
1000
nA
C
I
C
O
C
IO
5
-5
-5
5
9
0.2
V
EE
= V
SS
R
L
= 1KΩ
to V
SS
I
IS
< 2µA
(on all OFF
channels)
5
10
15
5
10
15
18
1.5
3
4
3.5
7
11
±10
-3
5
±0.1
7.5
3.5
7
11
±1
1.5
3
4
3.5
7
11
±1
1.5
3
4
pF
CONTROL (Address or Inhibit)
Input Low Voltage
V
IL
= VDD
thru
1KΩ
V
V
IH
Input High Voltage
V
µA
pF
I
IH,
I
IL
C
I
Input Leakage
Current
Input Capacitance
V
I
= 0/18V
* Determined by minimum feasible leakage measurement for automating testing.
4/10
STMICROELECTRONICS [ STMICROELECTRONICS ]
