HCC/HCF4011B/12B/23B
DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, CL = 50pF, RL = 200kΩ,
typical temperature coefficient for all VDD values is 0.3%/°C, all input rise and fall times = 20ns)
Test Conditions
Value
Symbol
Parameter
Unit
V DD (V) Min. Typ. Max.
t
PLH, tPHL Propagation Delay Time
5
125
60
250
120
90
ns
10
15
5
45
t
THL, tTLH Transition Time
100
50
200
100
80
ns
10
15
40
TEST CIRCUITS
Quiescent Device Current.
Noise Immunity.
Input Leakage Current.
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