512 Kbit / 1 Mbit / 2 Mbit / 4 Mbit Multi-Purpose Flash
SST39LF512 / SST39LF010 / SST39LF020 / SST39LF040
SST39VF512 / SST39VF010 / SST39VF020 / SST39VF040
Data Sheet
V
IHT
V
V
INPUT
REFERENCE POINTS
OUTPUT
OT
IT
V
ILT
395 ILL F12.1
AC test inputs are driven at VIHT (0.9 VDD) for a logic “1” and VILT (0.1 VDD) for a logic “0”. Measurement reference points
for inputs and outputs are VIT (0.5 VDD) and VOT (0.5 VDD). Input rise and fall times (10% ↔ 90%) are <5 ns.
Note: VIT - VINPUT Test
VOT - VOUTPUT Test
VIHT - VINPUT HIGH Test
V
ILT - VINPUT LOW Test
FIGURE 13: AC INPUT/OUTPUT REFERENCE WAVEFORMS
TO TESTER
TO DUT
C
L
395 ILL F11.1
FIGURE 14: A TEST LOAD EXAMPLE
©2001 Silicon Storage Technology, Inc.
S71150-03-000 6/01 395
15
SST [ SILICON STORAGE TECHNOLOGY, INC ]
