2 Mbit Page-Mode EEPROM
SST29EE020 / SST29LE020 / SST29VE020
Data Sheet
V
IHT
V
V
HT
HT
INPUT
REFERENCE POINTS
OUTPUT
V
V
LT
LT
V
ILT
307 ILL F12.1
AC test inputs are driven at VIHT (2.4 V) for a logic “1” and VILT (0.4 V) for a logic “0”. Measurement reference points for
inputs and outputs are VHT (2.0 V) and VLT (0.8 V). Input rise and fall times (10% ↔ 90%) are <10 ns.
Note: VHT - VHIGH Test
VLT - VLOW Test
VIHT - VINPUT HIGH Test
V
ILT - VINPUT LOW Test
FIGURE 13: AC INPUT/OUTPUT REFERENCE WAVEFORMS
TEST LOAD EXAMPLE
TO TESTER
V
DD
R
L HIGH
TO DUT
C
L
R
L LOW
307 ILL F13.1
FIGURE 14: A TEST LOAD EXAMPLE
©2001 Silicon Storage Technology, Inc.
S71062-06-000 6/01 307
17