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MBM29F400TC-70 参数 Datasheet PDF下载

MBM29F400TC-70图片预览
型号: MBM29F400TC-70
PDF下载: 下载PDF文件 查看货源
内容描述: FLASH存储器CMOS 4M ( 512K ×8 / 256K ×16 )位 [FLASH MEMORY CMOS 4M (512K x 8/256K x 16) BIT]
分类和应用: 存储
文件页数/大小: 48 页 / 541 K
品牌: SPANSION [ SPANSION ]
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MBM29F400TC-55/-70-90/MBM29F400BC-55/-70-90  
Write Operation Status  
Hardware Sequence Flags  
Status  
DQ7  
DQ7  
0
DQ6  
DQ5  
0
DQ3  
0
DQ2  
1
Embedded Program Algorithm  
Embedded Erase Algorithm  
Toggle  
Toggle  
0
1
Toggle  
Erase Suspend Read  
(Erase Suspended Sector)  
1
1
0
0
Toggle  
Data  
1*2  
In  
Erase  
Suspended  
Mode  
Progress  
Erase Suspend Read  
(Non-Erase Suspended Sector)  
Data  
DQ7  
Data  
Data Data  
Erase Suspend Program  
(Non-Erase Suspended Sector)  
Toggle*1  
0
0
Embedded Program Algorithm  
DQ7  
0
Toggle  
Toggle  
1
1
0
1
1
Exceeded Embedded Erase Algorithm  
N/A  
Time  
Limits  
Erase  
Suspended  
Mode  
Erase Suspend Program (Non-Erase  
Suspended Sector)  
DQ7  
Toggle  
1
0
N/A  
*1 : Performing successive read operations from any address will cause DQ6 to toggle.  
*2 : Reading the byte address being programmed while in the erase-suspend program mode will indicate logic “1”  
at the DQ2 bit. However, successive reads from the erase-suspended sector will cause DQ2 to toggle.  
Notes: DQ0 and DQ1 are reserve pins for future use. DQ4 is Fujitsu internal use only.  
DQ15 to DQ8 are “DON’T CARES” because there is for × 16 mode.  
DQ7  
Data Polling  
The MBM29F400TC/BC device feature Data Polling as a method to indicate to the host that the Embedded  
Algorithms are in progress or completed. During the Embedded Program Algorithm an attempt to read the device  
will produce the complement of the data last written to DQ7. Upon completion of the Embedded Program  
Algorithm, an attempt to read the device will produce the true data last written to DQ7. During the Embedded  
Erase Algorithm, an attempt to read the device will produce a “0” at the DQ7 output. Upon completion of the  
Embedded Erase Algorithm an attempt to read the device will produce a “1” at the DQ7 output. The flowchart  
for Data Polling (DQ7) is shown in “Data Polling Algorithm” in FLOW CHART.  
For Programing, the Data Polling is valid after the rising edge of fourth write pulse in the four write pulse sequence.  
For chip erase and sector erase, the Data Polling is valid after the rising edge of the sixth write pulse in the six  
write pulse sequence. Data Polling must be performed at sector address within any of the sectors being erased  
and not a protected sector. Otherwise, the status may not be valid. Once the Embedded Algorithm operation is  
close to being completed, the MBM29F400TC/BC data pins (DQ7) may change asynchronously while the output  
enable (OE) is asserted low. This means that the device is driving status information on DQ7 at one instant of  
time and then that byte’s valid data at the next instant of time. Depending on when the system samples the DQ7  
output, it may read the status or valid data. Even if the device has completed the Embedded Algorithm operation  
and DQ7 has a valid data, the data outputs on DQ6 to DQ0 may be still invalid. The valid data on DQ7 to DQ0 will  
be read on the successive read attempts.  
TheDataPollingfeatureisonlyactiveduringtheEmbeddedProgrammingAlgorithm,EmbeddedEraseAlgorithm  
or sector erase time-out (See “Hardware Sequence Flags”).  
See “AC Waveforms for Data Polling during Embedded Algorithm Operations” in TIMING DIAGRAM for the  
Data Polling timing specifications and diagrams.  
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