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MBM29DL161TE-70TN 参数 Datasheet PDF下载

MBM29DL161TE-70TN图片预览
型号: MBM29DL161TE-70TN
PDF下载: 下载PDF文件 查看货源
内容描述: 闪存的CMOS 16M ( 2M ×8 / 1M ×16 )位双操作 [FLASH MEMORY CMOS 16M (2M X 8/1M X 16) BIT Dual Operation]
分类和应用: 闪存存储内存集成电路光电二极管
文件页数/大小: 76 页 / 1048 K
品牌: SPANSION [ SPANSION ]
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MBM29DL16XTE/BE70/90  
Common Flash Memory Interface Code Table  
DQ15 to  
DQ0  
DQ15 to  
DQ0  
Description  
A6 to A0  
Description  
A6 to A0  
10h  
11h  
12h  
0051h  
0052h  
0059h  
Erase Block Region 2  
Information  
Query-unique ASCII string  
“QRY”  
31h  
32h  
33h  
34h  
001Eh  
0000h  
0000h  
0001h  
bit 15 to bit 0 : y = number of  
sectors  
Primary OEM Command Set  
02h: AMD/FJ standard type  
13h  
14h  
0002h  
0000h  
bit 31 to bit 16 : z = size  
(z×256 bytes)  
Address for Primary  
Extended Table  
15h  
16h  
0040h  
0000h  
40h  
41h  
42h  
0050h  
0052h  
0049h  
Query-unique ASCII string  
“PRI”  
Alternate OEM Command  
Set (00h = not applicable)  
17h  
18h  
0000h  
0000h  
Major version number, ASCII  
Minor version number, ASCII  
43h  
44h  
0031h  
0032h  
Address for Alternate OEM  
Extended Table  
19h  
1Ah  
0000h  
0000h  
Address Sensitive Unlock  
00h = Required  
VCC Min (write/erase)  
DQ7 to DQ4: 1 V,  
DQ3 to DQ0: 100 mV  
45h  
46h  
0000h  
0002h  
1Bh  
1Ch  
0027h  
0036h  
Erase Suspend  
02h = To Read & Write  
VCC Max (write/erase)  
DQ7 to DQ4: 1 V,  
DQ3 to DQ0: 100 mV  
Sector Protection  
00h = Not Supported  
X = Number of sectors in per  
group  
47h  
0001h  
VPP Min voltage  
VPP Max voltage  
1Dh  
1Eh  
0000h  
0000h  
Sector Temporary  
Unprotection  
01h = Supported  
Typical timeout per single  
48h  
49h  
0001h  
0004h  
1Fh  
20h  
21h  
22h  
23h  
24h  
25h  
0004h  
0000h  
000Ah  
0000h  
0005h  
0000h  
0004h  
byte/word write 2N µs  
Typical timeout for Min size  
Sector Protection  
Algorithm  
buffer write 2N µs  
Typical timeout per individual  
sector erase 2N ms  
Number of Sector for Bank 2  
00h = Not Supported  
1Fh = MBM29DL161TE  
1Ch = MBM29DL162TE  
18h = MBM29DL163TE  
10h = MBM29DL164TE  
1Fh = MBM29DL161BE  
1Ch = MBM29DL162BE  
18h = MBM29DL163BE  
10h = MBM29DL164BE  
Typical timeout for full chip  
erase 2N ms  
4Ah  
00XXh  
Max timeout for byte/word  
write 2N times typical  
Max timeout for buffer write  
2N times typical  
Max timeout per individual  
sector erase 2N times typical  
Burst Mode Type  
00h = Not Supported  
4Bh  
4Ch  
0000h  
0000h  
Max timeout for full chip  
26h  
27h  
0000h  
0015h  
erase 2N times typical  
Page Mode Type  
00h = Not Supported  
Device Size = 2N byte  
VACC (Acceleration) Supply  
Minimum  
DQ7 to DQ4: 1 V,  
DQ3 to DQ0: 100 mV  
Flash Device Interface  
description 02h : ×8/×16  
28h  
29h  
0002h  
0000h  
4Dh  
4Eh  
0085h  
0095h  
Max. number of bytes in  
multi-byte write = 2N  
2Ah  
2Bh  
0000h  
0000h  
VACC (Acceleration) Supply  
Maximum  
DQ7 to DQ4: 1 V,  
DQ3 to DQ0: 100 mV  
Number of Erase Block  
Regions within device  
2Ch  
0002h  
Erase Block Region 1  
Information  
2Dh  
2Eh  
2Fh  
30h  
0007h  
0000h  
0020h  
0000h  
Boot Type  
02h = MBM29DL16XBE  
03h = MBM29DL16XTE  
bit 15 to bit 0 : y = number of  
sectors  
4Fh  
50h  
00XXh  
0001h  
bit 31 to bit 16 : z = size  
(z×256 bytes)  
Program Suspend  
01h = Supported  
25  
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