EFM32G Data Sheet
Revision History
13.11 Revision 1.20
December 17th, 2010
This revision applies the following devices:
• EFM32G200
• EFM32G210
• EFM32G230
• EFM32G280
• EFM32G290
• EFM32G840
• EFM32G880
• EFM32G890
Increased max storage temperature.
Added data for <150°C and <70°C on Flash data retention.
Changed latch-up sensitivity test description.
Added IO leakage current.
For LQFP100 devices, updated ESD CDM value.
Added Flash current consumption.
Updated HFRCO data.
Updated LFRCO data.
Added graph for ADC Absolute Offset over temperature.
Added graph for ADC Temperature sensor readout.
13.12 Revision 1.11
November 17th, 2010
This revision applies the following devices:
• EFM32G200
• EFM32G210
• EFM32G230
• EFM32G280
• EFM32G290
• EFM32G840
• EFM32G880
• EFM32G890
Corrected maximum DAC clock speed for continuous mode.
Added DAC sample-hold mode voltage drift rate.
Added pulse widths detected by the HFXO glitch detector.
Added power sequencing information to Power Management section.
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