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S-1004NB50I-I6T1U 参数 Datasheet PDF下载

S-1004NB50I-I6T1U图片预览
型号: S-1004NB50I-I6T1U
PDF下载: 下载PDF文件 查看货源
内容描述: [Release delay time accuracy]
分类和应用:
文件页数/大小: 42 页 / 4284 K
品牌: SII [ SEIKO INSTRUMENTS INC ]
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BUILT-IN DELAY CIRCUIT (EXTERNAL DELAY TIME SETTING) VOLTAGE DETECTOR WITH SENSE PIN  
S-1004 Series  
Rev.2.1_01  
2. 5 Malfunction when VDD falls  
As seen in Figure 29, note that if the VDD pin voltage (VDD) drops steeply below 1.2 V when VDET < VSENSE  
+VDET, erroneous detection may occur.  
<
When VDD_Low 1.2 V, erroneous detection does not occur.  
When VDD_Low < 1.2 V, the more the VDD falling amplitude increases or the shorter the falling time becomes, the  
easier the erroneous detection.  
Perform thorough evaluation in actual application.  
VDD_High  
VDD  
VDD_Low (Voltage drops below 1.2 V.)  
+VDET  
VSENSE  
VDET  
VOUT falling influenced by VDD falling  
(erroneous detection)  
VOUT  
Figure 29  
The S-1004Cx50 example in Figure 30 shows an example of erroneous detection boundary conditions.  
12  
10  
8
6
4
2
0
Danger of erroneous  
detection  
0.1  
1
10  
100  
1000  
t
F
[s]  
Figure 30  
Remark Test conditions  
Product name: S-1004Cx50  
VSENSE VDET(S) + 0.1 V  
VDD_High  
VDD_Low  
:
:
:
VDD pin voltage before falling  
VDD pin voltage after falling (0.95 V)  
VDD_High VDD_Low  
ΔVDD  
:
tF:  
Falling time of VDD from VDD_High − ΔVDD × 10% to VDD_Low + ΔVDD × 10%  
V
V
DD_High  
DD_High  VDD 10%  
VDD  
VDD_Low  VDD 10%  
V
DD_Low  
t
F
Figure 31  
20  
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