SUD40N03-18P
N-Channel
30 V (D-S) 175 °C MOSFET
SPECIFICATIONS (T
J
= 25_C UNLESS OTHERWISE NOTED)
Parameter
Static
Drain-Source Breakdown Voltage
Gate Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Current
b
V
(BR)DSS
V
GS(th)
I
GSS
I
DSS
I
D(on)
V
GS
= 0 V, I
D
= 250
mA
V
DS
= V
GS
, I
D
= 250
mA
V
DS
= 0 V, V
GS
=
"20
V
V
DS
= 24 V, V
GS
= 0 V
V
DS
= 24 V, V
GS
= 0 V, T
J
= 125_C
V
DS
= 5 V, V
GS
= 10 V
V
GS
= 10 V, I
D
= 20 A
Drain-Source On-State R i
Resistance
b
D i S
O S
r
DS(on)
V
GS
= 10 V, I
D
= 20 A, T
J
= 125_C
V
GS
= 4.5 V, I
D
= 10 A
Forward Transconductance
b
g
fs
V
DS
= 15 V, I
D
= 20 A
10
0.021
40
0.014
0.018
0.029
0.027
S
W
30
V
1.0
"100
1
50
nA
mA
A
Symbol
Test Condition
Min
Typ
a
Max
Unit
Dynamic
a
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
c
Gate-Source Charge
c
Gate-Drain Charge
c
Turn-On Delay Time
c
Rise Time
c
Turn-Off Delay Time
c
Fall Time
c
C
iss
C
oss
C
rss
Q
g
Q
gs
Q
gd
t
d(on)
t
r
t
d(off)
t
f
V
DD
= 15 V, R
L
= 0 37
W
V,
0.37
I
D
^
40 A, V
GEN
= 10 V R
G
= 2 5
W
A
V,
2.5
V,
V
DS
= 15 V, V
GS
= 10 V I
D
= 40 A
V
V
GS
= 0 V, V
DS
= 25 V F = 1 MH
V
V,
MHz
1300
340
95
19
5
3
8
8.5
17
6
12
13
ns
25
9
30
nC
C
pF
F
Source-Drain Diode Ratings and Characteristic (T
C
= 25_C)
Continuous Current
Pulsed Current
Diode Forward Voltage
b
Source-Drain Reverse Recovery Time
I
S
I
SM
V
SD
t
rr
I
F
= 100 A, V
GS
= 0 V
I
F
= 40 A, di/dt = 100 A/ms
30
40
A
80
1.5
50
V
ns
Notes
a. Guaranteed by design, not subject to production testing.
b. Pulse test; pulse width
v
300
ms,
duty cycle
v
2%.
c. Independent of operating temperature.
2/4
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