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AO5804E 参数 Datasheet PDF下载

AO5804E图片预览
型号: AO5804E
PDF下载: 下载PDF文件 查看货源
内容描述: 双N沟道增强型场效应晶体管 [Dual N-Channel Enhancement Mode Field Effect Transistor]
分类和应用: 晶体晶体管场效应晶体管
文件页数/大小: 5 页 / 508 K
品牌: SHENZHENFREESCALE [ ShenZhen FreesCale Electronics. Co., Ltd ]
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AO5804E
Dual N-Channel Enhancement Mode Field
Effect Transistor
Electrical Characteristics (T
J
=25°C unless otherwise noted)
Symbol
Parameter
Conditions
I
D
=250µA, V
GS
=0V
V
DS
=20V, V
GS
=0V
T
J
=55°C
V
DS
=0V, V
GS
=±4.5V
V
DS
=0V, V
GS
=±8V
V
DS
=V
GS
I
D
=250µA
V
GS
=4.5V, V
DS
=5V
V
GS
=4.5V, I
D
=0.5A
R
DS(ON)
Static Drain-Source On-Resistance
T
J
=125°C
V
GS
=2.5V, I
D
=0.5A
V
GS
=1.8V, I
D
=0.3A
g
FS
V
SD
I
S
Forward Transconductance
Diode Forward Voltage
V
DS
=5V, I
D
=0.5A
I
S
=0.1A,V
GS
=0V
0.45
3
0.4
0.6
0.48
0.6
1.5
0.65
1
0.4
35
V
GS
=0V, V
DS
=10V, f=1MHz
8
6
0.63
V
GS
=4.5V, V
DS
=10V, I
D
=0.5A
0.08
0.16
4.5
V
GS
=5V, V
DS
=10V, R
L
=50Ω,
R
GEN
=3Ω
I
F
=0.5A, dI/dt=100A/µs
3.3
78
32
8
2
10
1
45
0.55
0.85
0.68
0.8
0.6
Min
20
1
5
±1
±100
1
Typ
Max
Units
V
µΑ
µA
µA
V
A
S
V
A
pF
pF
pF
nC
nC
nC
ns
ns
ns
ns
ns
nC
STATIC PARAMETERS
BV
DSS
Drain-Source Breakdown Voltage
I
DSS
I
GSS
V
GS(th)
I
D(ON)
Zero Gate Voltage Drain Current
Gate-Body leakage current
Gate Threshold Voltage
On state drain current
Maximum Body-Diode Continuous Current
DYNAMIC PARAMETERS
C
iss
Input Capacitance
C
oss
C
rss
Output Capacitance
Reverse Transfer Capacitance
SWITCHING PARAMETERS
Total Gate Charge
Q
g
Q
gs
Q
gd
t
D(on)
t
r
t
D(off)
t
f
t
rr
Q
rr
Gate Source Charge
Gate Drain Charge
Turn-On DelayTime
Turn-On Rise Time
Turn-Off DelayTime
Turn-Off Fall Time
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge I
F
=0.5A, dI/dt=100A/µs
A: The value of R
θJA
is measured with the device mounted on 1in
2
FR-4 board with 2oz. Copper, in a still air environment with T
A
=25°C. The value in
any given application depends on the user's specific board design. The current rating is based on the t ≤ 10s thermal resistance rating.
0.5
B: Repetitive rating, pulse width limited by junction temperature.
0.45
is the sum of the thermal impedence from junction to lead R
θJL
and lead to ambient.
C. The R
θJA
D. The static characteristics in Figures 1 to 6,12,14 are obtained using <300
µs
pulses, duty cycle 0.5% max.
E. These tests are performed with the device mounted on 1 in
2
FR-4 board with 2oz. Copper, in a still air environment with T
A
=25°C. The SOA curve
0.28
provides a single pulse rating.
0.18
F. The maximum current rating is limited by bond-wires
Rev3: Aug 2008
2/5
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