5. Reliability Test
Number
of
Damaged
Duration /
Cycle
Item
Reference
Test Conditions
EIAJ
ED-4701
Ta =-40oC(30min) ~
Thermal Shock
100 Cycle
1000 Hours
1000 Hours
1000 Hours
1000 Hours
0/22
0/22
0/22
0/22
0/22
100oC(30min)
High Temperature
Storage
EIAJ
ED-4701
Ta =100oC
Ta =60oC, RH=90%
Ta =-40oC
High Temp. High
Humidity Storage
EIAJ
ED-4701
Low Temperature
Storage
EIAJ
ED-4701
Operating
Endurance Test
Internal
Reference
Ta =25oC, IF =60mA
High Temperature
High Humidity Life
Test
Internal
Reference
Ta =60oC, RH=90%, IF =60mA
Ta =85oC, IF =60mA
500 Hours
500 Hours
0/22
0/22
High Temperature
Life Test
Internal
Reference
Low Temperature
Life Test
Internal
Reference
Ta =-40oC, IF =60mA
1KV at 1.5kΩ; 100pF
1000 Hours
3 Time
0/22
0/22
MIL-STD-
883D
ESD(HBM)
□ CRITERIA FOR JUDGING THE DAMAGE
Criteria for Judgment
Item
Symbol
Condition
MIN
MAX
IF =60mA
(20mA per die)
Forward Voltage
VF
IV
-
USL [1]× 1.2
IF =60mA
(20mA per die)
Luminous Intensity
LSL [2]× 0.5
-
Note : [1] USL : Upper Standard Level
[2] LSL : Lower Standard Level
Rev. 09
March 2010
www.acriche.com
SSC-QP-7-07-24 (Rev.00)
SEOUL [ Seoul Semiconductor ]
