CF5072 series
MEASUREMENT CIRCUITS
Measurement Circuit 1
Parameters: I
DD
, Duty1, Duty2, V
Opp
, t
r
, t
f
Measurement Circuit 4
Parameter: I
IL
A
I
DD
VDD1
R
P
VDD1
XIN
50Ω
L
S
XC
XR
VC
VSS1
VSS2
OUTN
VDD2
VDD2
OUT
50Ω
V
DD
−2V
Measurement Circuit 2
Parameters: V
OH
, V
OL
ina
Measurement Circuit 5
Parameter: Z
IN
VDD1
I
1
1kΩ
VDD1
XIN
VDD2
OUTN
50Ω
TEST
OUT
VSS1
VSS2
OUT is tied LOW (V
OL
)
OUTN is tied HIGH (V
OH
)
When XOUT = LOW: OUT is tied HIGH (V
OH
)
OUTN is tied LOW (V
OL
)
When XIN = HIGH:
lim
50Ω
V V
V
DD
−2V
V
OH
,V
OL
Measurement Circuit 6
Parameter: R
VC
Measurement Circuit 3
Parameters: V
IH
, V
IL
, t
OE
, t
OD
pre
R
P
VDD1
VDD2
XIN
XC
XR
OE
50Ω
L
S
OUTN
OUT
50Ω
Measurement Circuit 7
Parameter: R
S
V
DD
−2V
VDD1
I
3
VDD2
V
VSS1
VSS2
V
IH
,V
IL
V
IH
: output state changes V
SS
→
V
DD
V
IL
: output state changes V
DD
→
V
SS
OE: disable function
ry
OE
I
IL
A
VSS1
VSS2
VDD2
A
VC
Z
IN
= V
DD
/I
1
VSS1
VSS2
I
2
VDD1
VC
VDD2
A
XR
V
2
V
VSS1
R
VC
= V
2
/I
2
VSS2
A
V
3
V
XC
VSS1
R
S
= V
3
/I
3
VSS2
NIPPON PRECISION CIRCUITS INC.—6
SEIKO [ SEIKO EPSON CORPORATION ]
