S T P /B 3055L2
S amHop Microelectronics C orp.
Nov 23, 2004
N-C hannel Logic Level E nhancement Mode Field E ffect Transistor
P R ODUC T S UMMAR Y
V
DS S
20V
F E AT UR E S
( m
W
)
I
D
18A
R
DS (ON)
Max
S uper high dense cell design for low R
DS (ON
).
40 @ V
G S
= 4.5V
60 @ V
G S
= 2.5V
R ugged and reliable.
TO-220 and TO-263 P ackage.
D
D
G
D
S
G
S
S TB S E R IE S
TO-263(DD-P AK)
S TP S E R IE S
TO-220
G
S
ABS OLUTE MAXIMUM R ATINGS (T
C
=25 C unless otherwise noted)
P arameter
Drain-S ource Voltage
Gate-S ource Voltage
Drain C urrent-C ontinuous
a
-P ulsed
@ TJ=25 C
S ymbol
V
DS
V
GS
I
D
I
DM
I
S
P
D
T
J
, T
S TG
Limit
20
12
18
45
15
50
-55 to 175
Unit
V
V
A
A
A
W
C
Drain-S ource Diode Forward C urrent
Maximum P ower Dissipation @ Tc=25 C
Operating and S torage Temperature R ange
THE R MAL C HAR AC TE R IS TIC S
Thermal R esistance, Junction-to-C ase
Thermal R esistance, Junction-to-Ambient
R
JC
R
JA
3
50
C /W
C /W
1