ꢀ TEST CIRCUITS
*Pull-up circuit is not necessary for CMOS Output type, or R3112XXXXC.
Supply Current Test Circuit
ISS
Detector Threshold Test Circuit
+5V or
VDD
VDD
470k
Ω
VDD
R3112
Series
VIN
R3112X
Series
OUT
GND
GND
Nch Driver Output Current Test Circuit
Pch Driver Output Current Test Circuit *Apply only to
CMOS
VDD
VDD
IOUT
IOUT
R3112X
R3112
Series
VIN
VIN
Series
OUT
OUT
VDS
VDD+VDS
GND
GND
CD Pin Threshold Test Circuit
CD Pin Output Current Test Circuit
VDD
+5V or VDD
ICD
CD
VDD
R3112X
Series
VIN
470kΩ
CD R3112X
Series
VIN
VDS
VDS
OUT
GND
GND
Output Delay Time Test Circuit
+VDET+2.0V or 6.0V
+5V
470kΩ
VDD
Input
CD
Voltage
VIN
R3112X
Series
0.7V
GND
OUT
100%
CD
Output Voltage
GND
50%
GND
Rev. 1.10
- 7 -
RICOH [ RICOH ELECTRONICS DEVICES DIVISION ]
