HD74LS75
Testing Method
Test Circuit
V
CC
D G
Q
Q
R
L
P.G.
Z
out
= 50Ω
D
Q
Q
R
L
G
P.G.
Z
out
= 50Ω
C
L
C
L
Notes:
1. Test is put into the each flip-flop.
2. C
L
includes probe and jig capacitance.
3. All diodes are 1S2074(H).
Waveform
t
TLH
90%
1.3 V
10%
t
su
t
TLH
90% 90%
1.3 V 1.3 V
10%
10%
500ns
t
PLH
Q
1.3 V
t
PLH
t
PLH
1.3 V
t
PHL
t
PHL
1.3 V
V
OL
V
OH
1.3 V
V
OL
t
PLH
500ns
t
PHL
V
OH
t
h
t
THL
1µs
90%
1.3 V
10%
t
su
t
h
3V
1.3 V 1.3 V
0V
t
PHL
t
THL
1µs
3V
1.3 V
0V
D
G
Q
Notes:
1. Input pulse; D input: PRR = 500 kHz, G input; PRR = 1 MHz, t
THL
≤
10 ns,t
TLH
≤
10 ns.
2. When measuring propugation delay times from the D input, the corresponding G input must be
held high.
Rev.3.00, May 10, 2006, page 4 of 5
RENESAS [ RENESAS TECHNOLOGY CORP ]
