MIL-M-38510/101J
TABLE I. Electrical performance characteristics – Continued. 1/
Conditions
-55°C ≤ T ≤ +125°C
Group A
subgroups
Device
type
Limits
Min Max
Unit
A
Test
Symbol
NI(BB)
see figure 3
unless otherwise specified
Noise (referred to input)
broadband
7
7
01-06,
08
15
µVrms
±V
CC
= 20 V, T = +25°C,
A
bandwidth = 5 kHz
07
25
40
Noise (referred to input)
popcorn
NI(PC)
01,02,
04,06,
08
µVpk
±V
CC
= 20 V, T = +25°C,
A
bandwidth = 5 kHz
03,05,
07
80
1/
For devices marked with the “Q” certification mark, the parameters listed herein maybe guaranteed if not tested
to the limits specified herein in accordance with the manufacturer’s QM plan.
2/
3/
4/
Tests at common mode V
CM
= 0 V, V
= -15 V, and V = +15 V.
CM
CM
V
is not performed on device type 02, case I only, or on device type 08 for either case G or P.
IO(ADJ)
Continuous short circuit limits will be considerably less than the indicated test limits. Continuous I
at T ≤ +75°C
A
OS
is measured one channel at a time.
OS
will cause T to exceed the maximum of +175°C. For dual devices, I
J
5/
6/
Value shown is for single devices (01, 03, 04) only. For dual devices (02, 05, 06, and 08) this limit is for single
devices.
Note that gain is not specified at V
extremes. Some gain reduction is usually seen at V extremes.
IO(ADJ)
IO(ADJ)
For closed loop applications (closed loop gain less than 1,000), the open loop tests (AVS) prescribed herein should
guarantee a positive, reasonably linear, transfer characteristic. They do not, however, guarantee that the open
loop gain is linear, or even positive, over the operating range. If either of these requirements exist (positive open
loop gain or open loop gain linearity), they should be specified in the individual procurement document as
additional requirements.
7/
8/
R = 10 kΩ only for device types 04 and 06.
L
For transient response tests, C = 10 pF for device types 01, 02, 03, 04, 05, 06, and 08. Device type 07,
F
C = 47 pF. C includes the effects of stray capacitance.
F
F
9/
Minimum limit for device 08 is 0.4 V/µs at all temperatures.
10/ Minimum limits for device types 03 and 05 are 0.2 V/µs at -55°C and 0.3 V/µs at both +25°C and +125°C.
11/ Settling time is waived for method 5004, MIL-STD-883 except for device type 07.
13
RAYTHEON [ RAYTHEON COMPANY ]
