MIL-PRF-19500/355M
TABLE I. Group A inspection - Continued.
MIL-STD-750
Inspection 1/
Subgroup 4
Limit
Unit
Symbol
Method
Conditions
Min
3
Max
Small-signal short-circuit input
impedance
3201
3211
3216
V
= 5 V dc; I = 1 mA dc;
C
CE
30
1 x 10-3
60
kΩ
h
f = 1 kHz
ie
Small-signal open-circuit
reverse voltage transfer ratio
V
= 5 V dc; I = 1 mA dc;
CE
C
hre
f = 1 kHz
Small-signal open-circuit
output admittance
V
= 5 V dc; I = 1 mA dc;
CE
C
µmhos
h
oe
f = 1 kHz
Small-signal short-circuit
forward current transfer ratio
(magnitude hfe)
3306
V
= 5 V dc; I = 0.5 mA dc;
CE
C
3
20
5
| h
|
f = 20 MHz
fe
Open circuit output
capacitance
3236
3246
V
= 5 V dc; I = 0
E
CB
pF
C
obo
100 kHz ≤ f ≤ 1 MHz
Noise figure
V
= 5 V dc, I = 10 µA dc
CE
C
R = 10 kΩ, (see 4.5.7)
g
Test 1
Test 2
Test 3
f = 100 Hz
f = 1 kHz
f = 10 kHz
F1
F2
F3
5
3
3
dB
dB
dB
Subgroup 5
3041
20
nA dc
Bias condition D; V = 40 V dc
I
CES
Collector to emitter cutoff
current
CE
Subgroups 6 and 7
Not required
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed test in subgroup 1 of table I, double the sample size of the failed test or sequence of
tests. A failure in table I, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall
be rerun upon submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
6/ The larger number shall be placed in the denominator.
7/ When using table I, subgroup 2 as electrical end-points, this test is only required for JANS end-points.
15
RAYTHEON [ RAYTHEON COMPANY ]
