MIL-PRF-19500/355M
TABLE I. Group A inspection.
Inspection 1/
MIL-STD-750
Conditions
Limit
Unit
Symbol
Method
2071
Min
Max
Subgroup 1 2/
Visual and mechanical
examination 3/
n = 45 devices, c = 0
Solderability 3/ 4/
2026
1022
n = 15 leads, c = 0
Resistance to solvents
3/ 4/ 5/
n = 15 devices, c = 0
Temp cycling 3/ 4/
1051
1071
Test condition C, 25 cycles.
n = 22 devices, c = 0
Hermetic seal 4/ 6/
Fine leak
n = 22 devices, c = 0
Gross leak
Electrical measurements 4/
Bond strength 3/ 4/
Table I, subgroup 2
2037
Precondition
TA = +250°C at t = 24 hours or
TA = +300°C at t = 2 hours
n = 11 wires, c = 0
Decap internal visual (design
verification) 4/
2075
3131
N = 4 devices, c = 0
Subgroup 2
Thermal response
See 4.3.2.
°C/W
Z
θJX
Collector to base cutoff current
Emitter to base cutoff current
3036
3061
3011
10
10
µA dc
µA dc
V dc
Bias condition D, VCB = 70 V dc
Bias condition D, VEB = 6 V dc
ICBO1
IEBO1
Breakdown voltage, collector to
emitter
60
Bias condition D; I = 10 mA dc;
V
(BR)CEO
C
pulsed (see 4.5.1)
Collector to base cutoff current
3036
3041
2
2
nA dc
nA dc
Bias condition D; V = 45 V dc
I
I
CB
CBO2
CEO1
Collector to emitter cutoff
current
Bias condition D; V
= 5 V dc
CE
Emitter to base cutoff current
Forward-current transfer ratio
3061
3076
2
nA dc
Bias condition D; V = 5 V dc
I
EB
EBO2
V
= 5 V dc; I = 10 µA dc
h
CE
CE
C
FE1
2N2919, 2N2919L, 2N2919U
2N2920, 2N2920L, 2N2920U
60
175
240
600
Forward-current transfer ratio
3076
V
= 5 V dc; I = 100 µA dc
h
C
FE2
2N2919, 2N2919L, 2N2919U
2N2920, 2N2920L, 2N2920U
100
235
325
800
See footnotes at end of table.
13
RAYTHEON [ RAYTHEON COMPANY ]
