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HYS64T32000EDL-3.7-B2 参数 Datasheet PDF下载

HYS64T32000EDL-3.7-B2图片预览
型号: HYS64T32000EDL-3.7-B2
PDF下载: 下载PDF文件 查看货源
内容描述: 200针SO -DIMM DDR2 SDRAM模组 [200-Pin SO-DIMM DDR2 SDRAM Modules]
分类和应用: 动态存储器双倍数据速率
文件页数/大小: 86 页 / 4614 K
品牌: QIMONDA [ QIMONDA AG ]
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Internet Data Sheet  
HYS64T[32/64/128]xxxEDL–[25F/…/3.7](–)B2  
Small Outlined DDR2 SDRAM Modules  
Parameter  
Symbol  
DDR2–800  
Unit  
Note1)2)3)4)5)6)7)  
8)  
Min.  
Max.  
1)  
1)  
Internal Read to Precharge command delay  
Exit self-refresh to a non-read command  
Exit self-refresh to read command  
tRTP  
tXSNR  
tXSRD  
tXP  
7.5  
ns  
t
RFC +10  
ns  
200  
2
nCK  
nCK  
––  
––  
Exit precharge power-down to any valid  
command (other than NOP or Deselect)  
Exit power down to read command  
tXARD  
2
nCK  
nCK  
––  
––  
Exit active power-down mode to read command tXARDS  
8 – AL  
(slow exit, lower power)  
31)  
CKE minimum pulse width ( high and low pulse tCKE  
3
nCK  
width)  
Mode register set command cycle time  
MRS command to ODT update delay  
OCD drive mode output delay  
tMRD  
tMOD  
tOIT  
2
0
0
12  
12  
––  
nCK  
ns  
––  
1)  
1)  
ns  
Minimum time clocks remain ON after CKE  
asynchronously drops LOW  
tDELAY  
tIS + tCK .AVG  
tIH  
+
ns  
––  
1) For details and notes see the relevant Qimonda component data sheet  
2)  
DDQ = 1.8 V ± 0.1V; VDD = 1.8 V ± 0.1 V. See notes 5)6)7)8)  
V
3) Timing that is not specified is illegal and after such an event, in order to guarantee proper operation, the DRAM must be powered down  
and then restarted through the specified initialization sequence before normal operation can continue.  
4) Timings are guaranteed with CK/CK differential Slew Rate of 2.0 V/ns. For DQS signals timings are guaranteed with a differential Slew  
Rate of 2.0 V/ns in differential strobe mode and a Slew Rate of 1 V/ns in single ended mode.  
5) The CK / CK input reference level (for timing reference to CK / CK) is the point at which CK and CK cross. The DQS / DQS, RDQS / RDQS,  
input reference level is the crosspoint when in differential strobe mode.  
6) Inputs are not recognized as valid until VREF stabilizes. During the period before VREF stabilizes, CKE = 0.2 x VDDQ is recognized as low.  
7) The output timing reference voltage level is VTT  
.
8) New units, ‘tCK.AVG‘ and ‘nCK‘, are introduced in DDR2–667 and DDR2–800. Unit ‘tCK.AVG‘ represents the actual tCK.AVG of the input clock  
under operation. Unit ‘nCK‘ represents one clock cycle of the input clock, counting the actual clock edges. Note that in DDR2–400 and  
DDR2–533, ‘tCK‘ is used for both concepts. Example: tXP = 2 [nCK] means; if Power Down exit is registered at Tm, an Active command  
may be registered at Tm + 2, even if (Tm + 2 - Tm) is 2 x tCK.AVG + tERR.2PER(Min)  
.
9) When the device is operated with input clock jitter, this parameter needs to be derated by the actual tERR(6-10per) of the input clock. (output  
deratings are relative to the SDRAM input clock.) For example, if the measured jitter into a DDR2–667 SDRAM has tERR(6-10PER).MIN = – 272  
ps and tERR(6- 10PER).MAX = + 293 ps, then tDQSCK.MIN(DERATED) = tDQSCK.MIN tERR(6-10PER).MAX = – 400 ps – 293 ps = – 693 ps and  
tDQSCK.MAX(DERATED) = tDQSCK.MAX tERR(6-10PER).MIN = 400 ps + 272 ps = + 672 ps. Similarly, tLZ.DQ for DDR2–667 derates to tLZ.DQ.MIN(DERATED)  
= - 900 ps – 293 ps = – 1193 ps and tLZ.DQ.MAX(DERATED) = 450 ps + 272 ps = + 722 ps. (Caution on the MIN/MAX usage!)  
10) Input clock jitter spec parameter. These parameters are referred to as 'input clock jitter spec parameters' and these parameters apply to  
DDR2–667 and DDR2–800 only. The jitter specified is a random jitter meeting a Gaussian distribution.  
11) These parameters are specified per their average values, however it is understood that the relationship between the average timing and  
the absolute instantaneous timing holds all the times (min. and max of SPEC values are to be used for calculations).  
12) Input waveform timing tDS with differential data strobe enabled MR[bit10] = 0, is referenced from the input signal crossing at the VIH.AC level  
to the differential data strobe crosspoint for a rising signal, and from the input signal crossing at the VIL.AC level to the differential data strobe  
crosspoint for a falling signal applied to the device under test. DQS, DQS signals must be monotonic between Vil(DC)MAX and Vih(DC)MIN. See  
Figure 3.  
13) If tDS or tDH is violated, data corruption may occur and the data must be re-written with valid data before a valid READ can be executed.  
14) These parameters are measured from a data signal ((L/U)DM, (L/U)DQ0, (L/U)DQ1, etc.) transition edge to its respective data strobe signal  
((L/U/R)DQS / DQS) crossing.  
15) Input waveform timing tDH with differential data strobe enabled MR[bit10] = 0, is referenced from the differential data strobe crosspoint to  
the input signal crossing at the VIH.DC level for a falling signal and from the differential data strobe crosspoint to the input signal crossing  
at the VIL.DC level for a rising signal applied to the device under test. DQS, DQS signals must be monotonic between VIL.DC.MAX and  
VIH.DC.MIN. See Figure 3.  
Rev. 1.1, 2007-01  
18  
08212006-PKYN-2H1B  
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