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HYB25D128160CT-6 参数 Datasheet PDF下载

HYB25D128160CT-6图片预览
型号: HYB25D128160CT-6
PDF下载: 下载PDF文件 查看货源
内容描述: 128 - Mbit的双数据速率SDRAM [128-Mbit Double-Data-Rate SDRAM]
分类和应用: 存储内存集成电路光电二极管动态存储器双倍数据速率时钟
文件页数/大小: 35 页 / 1979 K
品牌: QIMONDA [ QIMONDA AG ]
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Internet Data Sheet  
HYB25D128xxxC[C/E/F/T](L)  
128-Mbit Double-Data-Rate SDRAM  
Parameter  
Symbol –7  
DDR266A  
Unit Note1)/ Test  
Condition  
Min.  
Max.  
Data hold skew factor  
tQHS  
+0.75  
+0.75  
ns  
ns  
ns  
TFBGA  
TSOPII  
Active to Autoprecharge delay  
tRAP  
tRAS  
tRC  
tRCD or tRASmin  
Active to Precharge command  
45  
65  
20  
120E+3 ns  
Active to Active/Auto-refresh command period  
Active to Read or Write delay  
ns  
ns  
µs  
tRCD  
tREFI  
10)  
Average Periodic Refresh Interval  
15.6  
Auto-refresh to Active/Auto-refresh command period  
Precharge command period  
Read preamble  
tRFC  
75  
ns  
ns  
tCK  
tCK  
ns  
tCK  
ns  
tCK  
ns  
tCK  
ns  
tCK  
tRP  
20  
tRPRE  
tRPST  
tRRD  
0.9  
0.40  
15  
1.0  
0.60  
Read postamble  
Active bank A to Active bank B command  
Write preamble  
tWPRE  
tWPRES  
tWPST  
tWR  
0.25  
0
11)  
Write preamble setup time  
Write postamble  
12)  
0.40  
15  
0.60  
Write recovery time  
Internal write to read command delay  
Exit self-refresh to non-read command  
Exit self-refresh to read command  
tWTR  
tXSNR  
tXSRD  
1
75  
200  
1) 0 °C TA 70 °C; VDDQ = 2.5 V ± 0.2 V, VDD = +2.5 V ± 0.2 V (DDR333); VDDQ = 2.6 V ± 0.1 V, VDD = +2.6 V ± 0.1 V (DDR400)  
2) Input slew rate 1 V/ns for DDR400, DDR333  
3) The CK/CK input reference level (for timing reference to CK/CK) is the point at which CK and CK cross: the input reference level for signals  
other than CK/CK, is VREF. CK/CK slew rate are 1.0 V/ns.  
4) Inputs are not recognized as valid until VREF stabilizes.  
5) The Output timing reference level, as measured at the timing reference point indicated in AC Characteristics (note 3) is VTT  
6) For each of the terms, if not already an integer, round to the next highest integer. tCK is equal to the actual system clock cycle time.  
7) HZ and tLZ transitions occur in the same access time windows as valid data transitions. These parameters are not referred to a specific  
voltage level, but specify when the device is no longer driving (HZ), or begins driving (LZ).  
8) Fast slew rate 1.0 V/ns , slow slew rate 0.5 V/ns and < 1 V/ns for command/address and CK & CK slew rate > 1.0 V/ns, measured  
between VIH(ac) and VIL(ac)  
.
t
.
9) These parameters guarantee device timing, but they are not necessarily tested on each device.  
10) A maximum of eight Autorefresh commands can be posted to any given DDR SDRAM device.  
11) The specific requirement is that DQS be valid (HIGH, LOW, or some point on a valid transition) on or before this CK edge. A valid transition  
is defined as monotonic and meeting the input slew rate specifications of the device. When no writes were previously in progress on the  
bus, DQS will be transitioning from Hi-Z to logic LOW. If a previous write was in progress, DQS could be HIGH, LOW, or transitioning from  
HIGH to LOW at this time, depending on tDQSS  
.
12) The maximum limit for this parameter is not a device limit. The device operates with a greater value for this parameter, but system  
performance (bus turnaround) degrades accordingly.  
Rev. 1.6, 2007-02  
29  
03292006-U5AN-6TI1  
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