RELEASED
PMC-Sierra, Inc.
PM9311/2/3/5 ETT1™ CHIP SET
Data Sheet
PMC-2000164
ISSUE 3
ENHANCED TT1™ SWITCH FABRIC
Table 38. Crossbar Signal Descriptions (Continued)
Name
I/O
Type
Description
ASIC Manufacturing Test Interface
ce0_io
I
I
I
I
I
I
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
Test (GND)
Test (GND)
Test (VDD)
Test (VDD)
Test (VDD)
Test (VDD)
ce0_scan
lssd_ce1_a
lssd_ce1_b
lssd_ce1_c1
lssd_ce1_c2
lssd_scan_
in[15:0]
I
CMOS
CMOS
Test: Scan input (GND)
Test: Scan output
lssd_scan_
out[15:0]
O
M_ackreg_L
M_pending_L
M_xreset_L
plltest_in
O
O
O
I
CMOS
CMOS
CMOS
CMOS
CMOS
Test (NC)
Test (NC)
Test (NC)
Test (GND)
Test output (NC)
plltest_out
O
Test (VDD) Should be driven to GND during
reset. All outputs are tristated when low.
test_di1
test_di2
I
I
CMOS
CMOS
Test (VDD) Should be driven to GND during
reset. All outputs are tristated when low.
test_lt
test_ri
I
I
CMOS
CMOS
Test (VDD)
Test (VDD)
PROPRIETARY AND CONFIDENTIAL TO PMC-SIERRA, INC., AND FOR ITS CUSTOMERS’ INTERNAL USE
239
PMC [ PMC-SIERRA, INC ]
