STANDARD PRODUCT
PM4328 TECT3
DATASHEET
PMC-2011596
ISSUE 1
HIGH DENSITY T1/E1 FRAMER
AND M13 MULTIPLEXER
Test-Logic-Reset
The test logic reset state is used to disable the TAP logic when the device is in
normal mode operation. The state is entered asynchronously by asserting input,
TRSTB. The state is entered synchronously regardless of the current TAP
controller state by forcing input, TMS high for 5 TCK clock cycles. While in this
state, the instruction register is set to the IDCODE instruction.
Run-Test-Idle
The run test/idle state is used to execute tests.
Capture-DR
The capture data register state is used to load parallel data into the test data
registers selected by the current instruction. If the selected register does not
allow parallel loads or no loading is required by the current instruction, the test
register maintains its value. Loading occurs on the rising edge of TCK.
Shift-DR
The shift data register state is used to shift the selected test data registers by
one stage. Shifting is from MSB to LSB and occurs on the rising edge of TCK.
Update-DR
The update data register state is used to load a test register's parallel output
latch. In general, the output latches are used to control the device. For
example, for the EXTEST instruction, the boundary scan test register's parallel
output latches are used to control the device's outputs. The parallel output
latches are updated on the falling edge of TCK.
Capture-IR
The capture instruction register state is used to load the instruction register with
a fixed instruction. The load occurs on the rising edge of TCK.
Shift-IR
The shift instruction register state is used to shift both the instruction register and
the selected test data registers by one stage. Shifting is from MSB to LSB and
occurs on the rising edge of TCK.
PROPRIETARY AND CONFIDENTIAL
178
PMC [ PMC-SIERRA, INC ]
