(Preliminary)PL610-01
1.8V to 3.3V, 1MHz to 130MHz XO IC
MEASUREMENT TEST CIRCUITS (MTC)
MTC-1: Rise Time, Fall Time, Duty Cycle,
VOL, VOH, Idd, Power Down Current, Output
Enable/Disable
MTC-3: Jitter and Phase Noise
A
0.1µF
VDD
0.1µF
VDD
XIN
0.1µF
XIN
R
CLK
FET
Probe
CLK
XOUT
XOUT
OE^ GND
OE^ GND
CL
MTC-2: Output Drive Current and Output
Impedance
MTC-4: Negative Resistance
0.1µF
VDD
VDD
XIN
XIN
Network
Analyzer
0.1µF
CLK
FET
Probe
CLK
XOUT
XOUT
OE^ GND
OE^ GND
V
0.1µF
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 4/2/07 Page 8