PCF8583
NXP Semiconductors
Clock and calendar with 240 x 8-bit RAM
9. Limiting values
Table 6.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter
Conditions
Min
Max
+7.0
50
Unit
V
VDD
IDD
ISS
VI
supply voltage
supply current
−0.8
-
mA
mA
V
ground supply current
input voltage
-
50
−0.8
VDD + 0.8
10
II
input current
-
mA
mA
mW
mW
V
IO
output current
-
10
Ptot
Po
total power dissipation
output power
-
300
-
50
[1]
[2]
[3]
[4]
VESD
electrostatic discharge
voltage
HBM
MM
-
±3000
±200
100
-
V
Ilu
latch-up current
-
mA
°C
Tstg
Tamb
storage temperature
ambient temperature
−65
−40
+150
+85
operating device
°C
[1] Pass level; Human Body Model (HBM), according to Ref. 5 “JESD22-A114”.
[2] Pass level; Machine Model (MM), according to Ref. 6 “JESD22-A115”.
[3] Pass level; latch-up testing according to Ref. 7 “JESD78” at maximum ambient temperature (Tamb(max)).
[4] According to the NXP store and transport requirements (see Ref. 9 “NX3-00092”) the devices have to be
stored at a temperature of +8 °C to +45 °C and a humidity of 25 % to 75 %. For long term storage products
deviant conditions are described in that document.
PCF8583
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© NXP B.V. 2010. All rights reserved.
Product data sheet
Rev. 06 — 6 October 2010
19 of 37
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