Philips Semiconductors
Product specification
High performance low power mixer FM IF system
SA615
–25dB,
–10dB,
–29dB,
929/50Ω PAD
–10.6dB,
50/50Ω PAD
–36dB,
156k/50Ω PAD
1500/50Ω PAD 50/50Ω PAD
51.5
C20
96.5
51.7
96.5
32.6
50.5
71.5
32.8
2430
C24
71.5
C22
1.3k
3880
R17
5.1k
C15
C19
C16
SW9
FLT1 SW8
C23
SW7
SW6
FLT2
SW5
C18
C21
C17
20
19
18
17
16
15
14
13
12
11
IF AMP
700
LIMITER
RSSI
MIXER
QUAD
DETECTOR
OSCILLATOR
MUTE
SWITCH
EMITTER
BASE
1
2
3
4
5
6
7
8
9
10
C9
R9
R10
R11
SW1
SW3
C8
SW4
C1
C2
L1
C7
L2
C10
C11
C12
C13
C5
R4
51.1
IFT1
SW2
X1
R1
C6
C26
C4
C3
R2
EXT.
LOC
OSC
R7
30.5
”C” WEIGHTED
AUDIO
R3
45MHZ
MEASUREMENT
CIRCUIT
C14
44.545
R8
39.2
R6
178
45.06
MHZ
MUTE
RSSI
OUTPUT
AUDIO UNMUTED
AUDIO
V
CC
MINI–CIRCUIT ZSC2–1B
Automatic Test Circuit Component List
C1 47pF NPO Ceramic
C2 180pF NPO Ceramic
C21
C23
C25
C26
100nF +10% Monolithic Ceramic
100nF +10% Monolithic Ceramic
100nF +10% Monolithic Ceramic
390pF +10% Monolithic Ceramic
C5
100nF +10% Monolithic Ceramic
C6 22pF NPO Ceramic
C7 1nF Ceramic
C8 10.0pF NPO Ceramic
Flt 1 Ceramic Filter Murata SFG455A3 or equiv
Flt 2 Ceramic Filter Murata SFG455A3 or equiv
IFT 1
L1
L2
455kHz 270µH TOKO #303LN-1129
300nH TOKO #5CB-1055Z
0.8µH TOKO 292CNS–T1038Z
C9
C10
C11
C12
C13
C14
100nF +10% Monolithic Ceramic
6.8µF Tantalum (minimum) *
100nF +10% Monolithic Ceramic
15nF +10% Ceramic
150pF +2% N1500 Ceramic
100nF +10% Monolithic Ceramic
X1 44.545MHz Crystal ICM4712701
R9
R17
R10
R11
100k +1% 1/4W Metal Film
5.1k +5% 1/4W Carbon Composition
100k +1% 1/4W Metal Film (optional)
100k +1% 1/4W Metal Film (optional)
C15 10pF NPO Ceramic
C17
C18
100nF +10% Monolithic Ceramic
100nF +10% Monolithic Ceramic
*NOTE: This value can be reduced when a battery is the power source.
SR00343
Figure 3. SA615 45MHz Test Circuit (Relays as shown)
6
1997 Nov 07
NXP [ NXP ]
