Philips Semiconductors
Product data
8-bit high-speed multiplying D/A converter
DAC-08 Series
TEST CIRCUITS
(Continued)
V
CC
R
IN
13
5
6
7
8
9
10
11
12
0.1
µF
R
L
SCOPE
dI
dt
+
I dV
R L dt
DAC-08
14
15
1
2
4
16
OPEN
10%
90%
2.0 mA
SLEWING TIME
V
EE
0
R
EQ
= 200
Ω
1 kΩ
R
P
V
IN
2V
0
3
SL00005
Figure 5. Reference Current Slew Rate Measurement
V
CC
I
CC
13
I
14
A
1
A
2
A
3
DIGITAL
INPUTS
A
4
A
5
A
6
A
7
A
8
(+)
V
I
I
EE
V
EE
5
6
7
8
9
10
11
12
I
I
3
4
16
I
O
R
L
C
DAC-08
15
1
2
V
O
OUTPUT
I
15
R
15
14
R
14
V
REF
(+)
NOTES:
(See text for values of C.)
Typical values of R
14
= R
15
= 1 kΩ
V
REF
= +2.0 V
C = 15 pF
V
I
and I
I
apply to inputs A
1
through A
8
The resistor tied to Pin 15 is to temperature compensate the bias current and may not be necessary for all applications.
I
+
K
A1
2
)
A2
4
)
A3
8
)
A4
16
)
A5
32
)
A6
64
)
A7
128
)
A8
256
O
where K
[
V REF
R 14
and A
N
= ‘1’ if A
N
is at High Level
A
N
= ‘0’ if A
N
is at Low Level
SL00006
Figure 6. Notation Definitions
2001 Aug 03
7
PHILIPS [ NXP SEMICONDUCTORS ]
