Philips Semiconductors
Product data
8-bit high-speed multiplying D/A converter
DAC-08 Series
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
TEST CONDITIONS
To
±
1/2LSB, all bits
switched on or off,
T
amb
= 25
°C
T
amb
= 25
°C,
each bit.
All bits switched
35
60
35
60
35
60
DAC-08C
Min
Typ
70
Max
135
Min
DAC-08E
Typ
70
Max
135
Min
DAC-08H
Typ
70
Max
135
UNIT
t
S
Settling time
Propagation delay
ns
t
PLH
t
PHL
Low-to-High
High-to-Low
ns
TEST CIRCUITS
V
REF
V–
V+
R
REF
16
14
3
13
4
1
2
R
f
DAC-08
15
R15
5-12
CONTROL
LOGIC
–
NE5534
+
ERROR
OUTPUT
REFERENCE DAC
ACCURACY > 0.006%
SL00003
Figure 3. Relative Accuracy Test Circuit
0.1
µF
V
CC
2.4 V
13
e
IN
+2.0 V
DC
14
15
1
2
4
16
1.0 kΩ
0.1
µF
FOR SETTLING TIME
MEASUREMENT
e
O
(ALL BITS
SWITCHED LOW
TO HIGH)
0.4 V
t
PHL
= t
PLH
= 10 ns
1.0 V
SETTLING TIME
R
L
= 500
Ω
0
t
S
= 70 ns TYPICAL
TO
±1/2
LSB
TRANSIENT 0
RESPONSE
-100 mV
t
PLH
R
L
= 50
Ω
PIN 4 TO GND
t
PHL
R
L
USE R
L
to GND
FOR TURN OFF
MEASUREMENT
1.4 V
5
6
7
8
9
10
11
12
51
Ω
DAC-08
1.0 kΩ
e
IN
0.1
µF
15 pF
3
V
EE
C
O
≤
25 pF
SL00004
Figure 4. Transient Response and Settling Time
2001 Aug 03
6
PHILIPS [ NXP SEMICONDUCTORS ]
