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74LVC74AD 参数 Datasheet PDF下载

74LVC74AD图片预览
型号: 74LVC74AD
PDF下载: 下载PDF文件 查看货源
内容描述: 双D- FL型IP- FL运算与置位和复位;正边沿触发 [Dual D-type flip-flop with set and reset; positive-edge trigger]
分类和应用: 触发器逻辑集成电路光电二极管
文件页数/大小: 10 页 / 102 K
品牌: PHILIPS [ NXP SEMICONDUCTORS ]
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Philips Semiconductors
Product Specification
Dual D-type flip-flop with set and reset;
positive-edge trigger
74LVC74A
LOGIC DIAGRAM (ONE FLIP-FLOP)
Q
C
C
C
C
D
C
RD
SD
CP
C
C
C
C
Q
C
SV00495
RECOMMENDED OPERATING CONDITIONS
SYMBOL
V
CC
V
I
V
O
T
amb
t
r
, t
f
PARAMETER
DC supply voltage (for max. speed performance)
DC supply voltage (for low-voltage applications)
DC input voltage range
DC output voltage range
Operating free-air temperature range
Input rise and fall times
V
CC
= 1.2 to 2.7V
V
CC
= 2.7 to 3.6V
CONDITIONS
LIMITS
MIN
2.7
1.2
0
0
–40
0
0
MAX
3.6
3.6
5.5
V
CC
+85
20
10
UNIT
V
V
V
°C
ns/V
ABSOLUTE MAXIMUM RATINGS
1
In accordance with the Absolute Maximum Rating System (IEC 134)
Voltages are referenced to GND (ground = 0V)
SYMBOL
V
CC
I
IK
V
I
I
OK
V
O
I
O
I
GND
, I
CC
T
stg
P
TOT
PARAMETER
DC supply voltage
DC input diode current
DC input voltage
DC output diode current
DC output voltage
DC output source or sink current
DC V
CC
or GND current
Storage temperature range
Power dissipation per package
– plastic mini-pack (SO)
– plastic shrink mini-pack (SSOP and TSSOP)
above +70°C derate linearly with 8 mW/K
above +60°C derate linearly with 5.5 mW/K
V
I
t
0
Note 2
V
O
uV
CC
or V
O
t
0
Note 2
V
O
= 0 to V
CC
CONDITIONS
RATING
–0.5 to +6.5
–50
–0.5 to +5.5
"50
–0.5 to V
CC
+0.5
"50
"100
–65 to +150
500
500
UNIT
V
mA
V
mA
V
mA
mA
°C
mW
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Jun 17
4