NXP Semiconductors
74HC74; 74HCT74
Dual D-type flip-flop with set and reset; positive edge-trigger
V
I
negative
pulse
GND
t
W
90 %
V
M
10 %
t
f
t
r
t
r
t
f
90 %
V
M
10 %
t
W
V
CC
G
VI
VO
V
M
V
I
positive
pulse
GND
V
M
DUT
RT
CL
001aah768
Test data is given in
Definitions test circuit:
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= Load capacitance including jig and probe capacitance.
R
L
= Load resistance.
S1 = Test selection switch.
Fig 9.
Table 10.
Type
74HC74
74HCT74
Test circuit for measuring switching times
Test data
Input
V
I
V
CC
3V
t
r
, t
f
6 ns
6 ns
Load
C
L
15 pF, 50 pF
15 pF, 50 pF
R
L
1 k
1 k
t
PLH
, t
PHL
t
PLH
, t
PHL
Test
74HC_HCT74
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© NXP B.V. 2012. All rights reserved.
Product data sheet
Rev. 4 — 27 August 2012
12 of 21
PHILIPS [ NXP SEMICONDUCTORS ]
