74HC4052; 74HCT4052
NXP Semiconductors
Dual 4-channel analog multiplexer/demultiplexer
V
CC
Sn
10 μF
nYn/nZ
nZ/nYn
V
V
os
is
V
EE
GND
R
L
C
L
dB
001aah829
Fig 16. Test circuit for measuring sine-wave distortion
V
CC
Sn
0.1 μF
nYn/nZ
nZ/nYn
GND
V
V
os
is
V
EE
R
L
C
L
dB
001aah871
VCC = 4.5 V; GND = 0 V; VEE = 4.5 V; RL = 600 ; RS = 1 k.
a. Test circuit
001aae332
0
α
iso
(dB)
−20
−40
−60
−80
−100
2
3
4
5
6
10
10
10
10
10
10
f (kHz)
i
b. Isolation (OFF-state) as a function of frequency
Fig 17. Test circuit for measuring isolation (OFF-state)
74HC_HCT4052
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© NXP B.V. 2012. All rights reserved.
Product data sheet
Rev. 10 — 19 July 2012
18 of 29
NXP [ NXP ]
