Philips Semiconductors
Product specification
Quad 2-input AND gate
74HC08; 74HCT08
TEST CONDITIONS
OTHER
SYMBOL
PARAMETER
MIN.
TYP.
MAX.
UNIT
VCC (V)
Tamb = −40 to +125 °C
VIH HIGH-level input voltage
2.0
4.5
6.0
2.0
4.5
6.0
1.5
−
−
−
−
−
−
−
−
−
V
3.15
4.2
−
V
V
V
V
V
VIL
LOW-level input voltage
0.5
−
1.35
1.8
−
VOH
HIGH-level output voltage VI = VIH or VIL
IO = −20 µA
IO = −20 µA
IO = −4.0 mA
IO = −20 µA
IO = −5.2 mA
2.0
4.5
4.5
6.0
6.0
1.9
4.4
3.7
5.9
5.2
−
−
−
−
−
−
−
−
−
−
V
V
V
V
V
VOL
LOW-level output voltage
VI = VIH or VIL
IO = 20 µA
2.0
4.5
4.5
6.0
6.0
6.0
6.0
−
−
−
−
−
−
−
−
−
−
−
−
−
−
0.1
V
IO = 20 µA
0.1
V
IO = 4.0 mA
IO = 20 µA
0.4
V
0.1
V
IO = 5.2 mA
VI = VCC or GND
0.4
V
ILI
input leakage current
±1.0
±10.0
µA
µA
IOZ
3-state output OFF current VI = VIH or VIL;
VO = VCC or GND
ICC
quiescent supply current
VI = VCC or GND; IO = 0 6.0
−
−
40
µA
2003 Jul 25
8
NXP [ NXP ]
