Philips Semiconductors Programmable Logic Devices
Product specification
ECL programmable array logic
10H20EV8/10020EV8
AC TEST CIRCUIT
+2.0V + 0.010V
25µF
0.1µF
L
1
PULSE
GENERATOR
L
3
V
CO1
I
1
V
CC
V
CO2
F
X
L
2
SCOPE
C
L
R
T
I
11
SCOPE
R
T
CLK/I
12
F
M
DUT
F
Y
F
N
V
EE
25µF
0.01µF
–2.5V + 0.010V FOR 10020EV8
–3.2V + 0.010V FOR 10H20EV8
NOTES:
1. Use decoupling capacitors of 0.1µF and 25µF from GND to V
CC
, and 0.01µF and 25µF from GND to V
EE
(0.01 and 0.1µF capacitors
should be NPO Ceramic or MLC type). Decoupling capacitors should be placed as close as physically possible to the DUT and lead
length should be kept to less than
1
/
4
inch (6mm).
2. All unused inputs should be connected to either HIGH or LOW state consistent with the LOGIC function required.
3. All unused outputs are loaded with 50Ω to GND.
4. L
1
and L
2
are equal length 50Ω impedance lines. L
3
, the distance from the DUT pin to the junction of the cable from the Pulse
Generator and the cable to the Scope, should not exceed
1
/
4
inch (6mm).
5. R
T
= 50Ω terminator internal to Scope.
6. The unmatched wire stub between coaxial cable and pins under test must be less than
1
/
4
inch (6mm) long for proper test.
7. C
L
= Fixture and stray capacitance
≤
3pF.
8. Any unterminated stubs connected anywhere along the transmission line between the Pulse Generator and the DUT or between the
DUT and the Scope should not exceed
1
/
4
inch (6mm) in length (refer to section on AC setup procedure).
9. All 50Ω resistors should have tolerance of
±
1% or better.
10. Test procedures are shown for only one input or set of input conditions. Other inputs are tested in the same manner.
October 22, 1993
121
PHILIPS [ NXP SEMICONDUCTORS ]
