Philips Semiconductors Programmable Logic Devices
Product specification
ECL programmable array logic
10H20EV8/10020EV8
DC ELECTRICAL CHARACTERISTICS 10H20EV8
0°C
≤
T
amb
≤
+75°C, V
EE
= –5.2V
±
5%, V
CC
= V
CO1
= V
CO2
= GND
LIMITS
4
SYMBOL
V
OH
PARAMETER
1
High level output voltage
TEST CONDITIONS
2
V
IN
= V
IH
MIN or V
IL
MAX
T
amb
0°C
+25°C
+75°C
0°C
+25°C
+75°C
0°C
+75°C
0°C
+75°C
0°C to +75°C
250
mA
0.3
MIN
–1020
–980
–920
–1950
–1950
–1950
MAX
–840
–810
–735
–1630
–1630
–1600
220
UNITS
mV
V
OL
Low level output voltage
V
IN
= V
IH
MIN or V
IL
MAX
mV
I
IH
I
IL
–I
EE
High level input current
Low level input current
Supply current
V
IN
= V
IH
MAX
V
IN
= V
IL
MIN
Except I/O Pins
V
EE
= MAX
All inputs = V
IH
MAX
µA
µA
DC ELECTRICAL CHARACTERISTICS 10020EV8
0°C
≤
T
amb
≤
+85°C, –4.8V
≤
V
EE
≤
–4.2V, V
CC
= V
CO1
= V
CO2
= GND
LIMITS
4
SYMBOL
PARAMETER
1
TEST CONDITIONS
2
V
EE
= –4.2V
V
OH
High level output voltage
V
IN
= V
IH
MAX or V
IL
MIN
V
EE
= –4.5V
V
EE
= –4.8V
Outputs
V
OHT
High level output threshold voltage
Loaded
with 50Ω
to –2.0V
V
OLT
Low level output threshold voltage
±
0.010V
Apply V
IHMIN
or V
ILMAX
to
one input at a time, other
inuts at V
IHMAX
or V
ILMIN.
Apply V
IHMIN
or V
ILMAX
to
one input at a time, other
inuts at V
IHMAX
or V
ILMIN.
V
EE
= –4.2V
V
EE
= –4.5V
V
EE
= –4.8V
V
EE
= –4.2V
V
EE
= –4.5V
V
EE
= –4.8V
V
EE
= –4.2V
V
OL
Low level output voltage
Inuts at V
IHMAX
or V
ILMIN.
V
EE
= –4.5V
V
EE
= –4.8V
I
IH
I
IL
–I
EE
High level input current
Low level input current
V
EE
supply current
One input under test at V
IHMAX
. Other inputs at
V
ILMIN
.
One input under test at V
ILMIN
. Other inputs at
V
IHMAX
.
All inputs at V
IHMAX
.
0.5
230
–1810
–1810
–1830
–1705
MIN
–1020
–1025
–1035
–1030
–1035
–1045
–1595
–1610
–1610
–1605
–1620
–1620
220
–955
TYP
MAX
–870
–880
–880
UNITS
mV
mV
mV
mV
mV
mV
mV
mV
mV
mV
mV
mV
µA
µA
mA
NOTES:
1. All voltage measurements are referenced to the ground terminal.
2. Each ECL 10KH/100K series device has been designed to meet the DC specification after thermal equilibrium has been established.
Thermal equilibrium is established by applying power for at least 2 minutes, while maintaining transverse airflow of 2.5 meters/sec (500
linear feet/min.) over the device, mounted either in a test socket or on a printed circuit board. Test voltage values are given in the DC
operating conditions table. Conditions for testing shown in the tables are not necessarily worst case. For worst case testing guidelines, refer
to DC Testing, Chapter 1, Section 3, of the
Philips Semiconductors 10/100K ECL Data Handbook
.
3. Terminals not specifically referenced can be left electrically open. Open inputs assume a logic LOW state. Any unused pins can be
terminated to –2V. If tied to V
EE
, it must be through a resistor > 10K. It is recommended that pins that have been programmed as RESET,
PRESET, or CLOCK inputs not be left open due to the possibility of false triggering from internally and externally generated switching
transients.
4. The specified limits represent the worst case values for the parameter. Since these worst case values normally occur at the supply voltage
and temperature extremes, additional noise immunity can be achieved by decreasing the allowable operating condition ranges.
October 22, 1993
118
PHILIPS [ NXP SEMICONDUCTORS ]
